Restricted motion of a GaAs surface Fermi level caused by excess As

Author(s):  
Yoshinori Wada
2008 ◽  
Vol 93 (4) ◽  
pp. 041913 ◽  
Author(s):  
Houssam Chouaib ◽  
Catherine Bru-Chevallier ◽  
Aleksandra Apostoluk ◽  
Wojciech Rudno-Rudzinski ◽  
Melania Lijadi ◽  
...  

2018 ◽  
Vol 29 (31) ◽  
pp. 314003 ◽  
Author(s):  
Prokhor A Alekseev ◽  
Mikhail S Dunaevskiy ◽  
George E Cirlin ◽  
Rodion R Reznik ◽  
Alexander N Smirnov ◽  
...  

1993 ◽  
Vol 11 (4) ◽  
pp. 1075-1082 ◽  
Author(s):  
Yi‐Ming Xiong ◽  
Paul G. Snyder ◽  
John A. Woollam

1999 ◽  
Vol 38 (Part 1, No. 2B) ◽  
pp. 1195-1199 ◽  
Author(s):  
Takeshi Kikawa ◽  
Shinichiro Takatani ◽  
Hiroshi Masuda ◽  
Tomonori Tanoue

2003 ◽  
Vol 93 (7) ◽  
pp. 4169-4172 ◽  
Author(s):  
Peng Jin ◽  
X. Q. Meng ◽  
Z. Y. Zhang ◽  
C. M. Li ◽  
B. Xu ◽  
...  

1999 ◽  
Vol 573 ◽  
Author(s):  
J. S. Hwan ◽  
G. S. Chang

ABSTRACTIn this study, we develop a novel approach to determine the surface Fermi level and the surface state densities of semiconductors. The built-in electric field and thus the surface barrier height are evaluated from the Franz-Keldysh oscillations in the PR spectra. Based on the thermionic-emission theory and current-transport theory, the surface state density as well as the pinning position of the surface Fermi level can be determined from the dependence of the surface barrier height on the pump beam intensity. Even though this method is significantly simpler, easier to perform, and time efficient compared with other approaches, the results obtained agree with the literature.


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