Structure of Sb monolayers on Ge(111)2×1: A combined study using core-level photoemission, x-ray standing waves, and surface extended x-ray absorption fine structure

1993 ◽  
Vol 11 (4) ◽  
pp. 1449 ◽  
Author(s):  
T. Kendelewicz
Keyword(s):  
Fine Structure ◽  
Standing Waves ◽  
Core Level ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Depth resolved x-ray absorption fine structure study in magnetic multilayers using x-ray standing waves

2007 ◽  
Vol 101 (9) ◽  
pp. 09D117 ◽  
Author(s):  
Ajay Gupta ◽  
Dileep Kumar ◽  
Carlo Meneghini ◽  
Jorg Zegenhagen
Keyword(s):  
Fine Structure ◽  
Standing Waves ◽  
Structure Study ◽  
Magnetic Multilayers ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Structure of Prototypical Semiconductor Surfaces and Interfaces Investigated by Photoemission Extended X-Ray Absorption Fine Structure (PEXAFS)

1998 ◽  
Vol 05 (05) ◽  
pp. 1057-1086 ◽  
Author(s):  
P. S. Mangat ◽  
P. Soukiassian
Keyword(s):  
Fine Structure ◽  
Alkali Metals ◽  
Structural Changes ◽  
Core Level ◽  
Level Shift ◽  
Semiconductor Surfaces ◽  
X Ray ◽  
Absorption Fine ◽  
Surfaces And Interfaces ◽  
X Ray Absorption

Extended X-ray absorption fine structure (EXAFS) has been known for half a century. However, using synchrotron radiation, it has developed into a powerful tool for determining the atomic structure of a wide variety of surfaces and interfaces. The power of this technique lies in its sensitivity to the local environment of a particular element. Photoemission extended X-ray absorption fine structure (PEXAFS) is a new variation of electron detection surface EXAFS (SEXAFS) using photoemission spectroscopy in the constant initial state mode, Due to small escape depths, a very high surface sensitivity is achieved. Other major advantages of this new technique include (i) an improved signal/noise ratio allowing very short data collection times, which is an especially useful feature for short lifetime surfaces, and (ii) double-checking interatomic distances. Combined with core level and valence band photoemission spectroscopies. PEXAFS provides the exceptional ability to probe the atomic geometry and the electronic structure at the same time and for the same surface. It thus gives access to important issues, such as (i) surface reconstruction and/or relaxation, (ii) bonding nature, (iii) adsorption site and (iv) initial interface formation. Furthermore, it could be used to clarify photoemission core level shift origin by allowing one to discriminate structural changes from other causes as initial or final state effects. This article reviews the latest PEXAFS investigations for model elemental (silicon) and compound (indium phosphide) semiconductor surfaces and their interfaces with alkali metals, antimony, aluminum, bismuth and silver.

Determination of the Sb/Si(111) interfacial structure by back-reflection x-ray standing waves and surface extended x-ray-absorption fine structure

1991 ◽  
Vol 44 (7) ◽  
pp. 3475-3478 ◽  
Author(s):  
J. C. Woicik ◽  
T. Kendelewicz ◽  
K. E. Miyano ◽  
P. L. Cowan ◽  
C. E. Bouldin ◽  
...  
Keyword(s):  
Fine Structure ◽  
Standing Waves ◽  
Interfacial Structure ◽  
X Ray ◽  
Back Reflection ◽  
Absorption Fine ◽  
X Ray Absorption

Chemical states of nitrogen in ZnO studied by near-edge X-ray absorption fine structure and core-level photoemission spectroscopies

2006 ◽  
Vol 600 (7) ◽  
pp. L81-L85 ◽  
Author(s):  
M. Petravic ◽  
P.N.K. Deenapanray ◽  
V.A. Coleman ◽  
C. Jagadish ◽  
K.-J. Kim ◽  
...  
Keyword(s):  
Fine Structure ◽  
Core Level ◽  
X Ray ◽  
Absorption Fine ◽  
Chemical States ◽  
X Ray Absorption

Core-level photoemission and near-edge x-ray absorption fine-structure studies of GaN surface under low-energy ion bombardment

2004 ◽  
Vol 95 (10) ◽  
pp. 5487-5493 ◽  
Author(s):  
Mladen Petravic ◽  
Prakash N. K. Deenapanray ◽  
Victoria A. Coleman ◽  
Ki-jeong Kim ◽  
Bongsoo Kim ◽  
...  
Keyword(s):  
Fine Structure ◽  
Ion Bombardment ◽  
Core Level ◽  
Low Energy ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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