Chemical states of nitrogen in ZnO studied by near-edge X-ray absorption fine structure and core-level photoemission spectroscopies

2006 ◽  
Vol 600 (7) ◽  
pp. L81-L85 ◽  
Author(s):  
M. Petravic ◽  
P.N.K. Deenapanray ◽  
V.A. Coleman ◽  
C. Jagadish ◽  
K.-J. Kim ◽  
...  
1998 ◽  
Vol 05 (05) ◽  
pp. 1057-1086 ◽  
Author(s):  
P. S. Mangat ◽  
P. Soukiassian

Extended X-ray absorption fine structure (EXAFS) has been known for half a century. However, using synchrotron radiation, it has developed into a powerful tool for determining the atomic structure of a wide variety of surfaces and interfaces. The power of this technique lies in its sensitivity to the local environment of a particular element. Photoemission extended X-ray absorption fine structure (PEXAFS) is a new variation of electron detection surface EXAFS (SEXAFS) using photoemission spectroscopy in the constant initial state mode, Due to small escape depths, a very high surface sensitivity is achieved. Other major advantages of this new technique include (i) an improved signal/noise ratio allowing very short data collection times, which is an especially useful feature for short lifetime surfaces, and (ii) double-checking interatomic distances. Combined with core level and valence band photoemission spectroscopies. PEXAFS provides the exceptional ability to probe the atomic geometry and the electronic structure at the same time and for the same surface. It thus gives access to important issues, such as (i) surface reconstruction and/or relaxation, (ii) bonding nature, (iii) adsorption site and (iv) initial interface formation. Furthermore, it could be used to clarify photoemission core level shift origin by allowing one to discriminate structural changes from other causes as initial or final state effects. This article reviews the latest PEXAFS investigations for model elemental (silicon) and compound (indium phosphide) semiconductor surfaces and their interfaces with alkali metals, antimony, aluminum, bismuth and silver.


1998 ◽  
Vol 29 ◽  
pp. S235-S236 ◽  
Author(s):  
S. Tohno ◽  
J. Kawai ◽  
S. Chatani ◽  
M. Ohta ◽  
Y. Kitajima ◽  
...  

2008 ◽  
Vol 57 (3) ◽  
pp. 411-417 ◽  
Author(s):  
M. Takaoka ◽  
T. Yamamoto ◽  
S. Fujiwara ◽  
K. Oshita ◽  
N. Takeda ◽  
...  

In this study, the chemical states of chromium (Cr), arsenic (As), and selenium (Se) in sewage sludge incineration ash were determined by X-ray absorption fine structure (XAFS) spectroscopy. Sewage sludge incineration ash was sampled from several facilities, and XAFS measurements were carried out with a beam line BL01B1 at the SPring-8 facility. Cr K-edge X-ray absorption near-edge structure (XANES) spectra suggested that Cr compounds were predominantly speciated as Cr(III) and the fraction of Cr(VI) was very minor. Compared to the reference materials, Cr XANES spectra of the incineration ashes were similar to those of FeCr2O4, Cr(OH)3, and CaCr2O4. As K-edge XANES spectra indicated that As(V) compounds were present in incineration ashes. Because the chemical state of As in sewage sludge was As3 +  in our previous study, we speculated that the chemical state of As changed into As(V) during the incineration process. According to Se K-edge XANES spectra, Se compounds were predominantly Se(IV), and a slight difference was observed in the chemical states amongst facilities using inorganic or organic coagulants in the dewatering process.


2004 ◽  
Vol 95 (10) ◽  
pp. 5487-5493 ◽  
Author(s):  
Mladen Petravic ◽  
Prakash N. K. Deenapanray ◽  
Victoria A. Coleman ◽  
Ki-jeong Kim ◽  
Bongsoo Kim ◽  
...  

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