Fabrication and characterization of high-flatness mesa-etched silicon nitride x-ray masks

1991 ◽  
Vol 9 (6) ◽  
pp. 3287 ◽  
Author(s):  
A. Moel
Keyword(s):  
Silicon Nitride ◽  
X Ray ◽  
Etched Silicon ◽  
Fabrication And Characterization

scholarly journals Fabrication and characterization of Si-based soft x-ray mirrors

1991 ◽  
Author(s):  
Bernt Schmiedeskamp ◽  
Bernhard Heidemann ◽  
Ulf Kleineberg ◽  
Andreas Kloidt ◽  
Mikhael Kuehne ◽  
...  
Keyword(s):  
X Ray ◽  
Fabrication And Characterization

scholarly journals Fabrication and Characterization of Al/NiO Energetic Nanomultilayers

2015 ◽  
Vol 2015 ◽  
pp. 1-6 ◽  
Author(s):  
YiChao Yan ◽  
Wei Shi ◽  
HongChuan Jiang ◽  
Jie Xiong ◽  
WanLi Zhang ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Total Thickness ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
Metallic Oxide ◽  
Promising Candidate ◽  
X Ray ◽  
Thermal Boundary Conductance ◽  
Fabrication And Characterization

The redox reaction between Al and metallic oxide has its advantage compared with intermetallic reaction and Al/NiO nanomutlilayers are a promising candidate for enhancing the performance of energetic igniter. Al/NiO nanomutlilayers with different modulation periods are prepared on alumina substrate by direct current (DC) magnetron sputtering. The thicknesses of each period are 250 nm, 500 nm, 750 nm, 1000 nm, and 1500 nm, respectively, and the total thickness is 3 μm. The X-ray diffraction (XRD) and scanning electron microscope (SEM) results of the as-deposited Al/NiO nanomutlilayers show that the NiO films are amorphous and the layered structures are clearly distinguished. The X-ray photoelectron spectroscopy (XPS) demonstrates that the thickness of Al2O3increases on the side of Al monolayer after annealing at 450°C. The thermal diffusion time becomes greater significantly as the amount of thermal boundary conductance across the interfaces increases with relatively smaller modulation period. Differential scanning calorimeter (DSC) curve suggests that the energy release per unit mass is below the theoretical heat of the reaction due to the nonstoichiometric ratio between Al and NiO and the presence of impurities.

scholarly journals Preparation and Characterization of Porous Ceramic Membranes for Micro-Filtration from Clay/CuZn Using Extrusion Methods

2018 ◽  
Vol 156 ◽  
pp. 08015 ◽  
Author(s):  
Muh Amin ◽  
Muhammad Subri
Keyword(s):  
Porous Ceramic ◽  
Ceramic Materials ◽  
Ceramic Membranes ◽  
Extrusion Process ◽  
X Ray Diffraction ◽  
Percentage Composition ◽  
X Ray ◽  
Ceramic Support ◽  
Fabrication And Characterization

In this study, fabrication and characterization of ceramic membranes preparation was carried out. Porous ceramic membranes were fabricated by extrusion process from different percentage composition of CuZn on (80 wt% Clay, 10 wt% TiO2, 5 wt% Carbon and 5 wt% PVA). The fabricated membranes were sintered at 900°C for 1 hour in an electrical box furnace with heating rate 1oC/min and holding time for 1 hour. Apparent density and porosity were determined by standar methods for ceramic materials. Phase composition of the ceramic support was established by X-Ray Diffraction analysis. SEM studies of the membranes added at different CuZn were carried out.

Fabrication and characterization of silicon nitride-based inert matrix fuels sintered with magnesium silicates

2011 ◽  
Vol 53 (7) ◽  
pp. 1078-1081
Author(s):  
Toshiyuki Usuki ◽  
Katsumi Yoshida ◽  
Toyohiko Yano ◽  
Shuhei Miwa ◽  
Masahiko Osaka
Keyword(s):  
Silicon Nitride ◽  
Inert Matrix ◽  
Magnesium Silicates ◽  
Fabrication And Characterization ◽  
Inert Matrix Fuels

Fabrication and characterization of Er doped silicon-rich silicon nitride(SRSN) micro-disks

2008 ◽  
Author(s):  
Jee Soo Chang ◽  
Myung-Ki Kim ◽  
Yong-Hee Lee ◽  
Jung H. Shin ◽  
Gun Yong Sung
Keyword(s):  
Silicon Nitride ◽  
Doped Silicon ◽  
Fabrication And Characterization ◽  
Er Doped

Fabrication and Characterization of LaOBr:Eu3+ Luminescent Nanofibers

2015 ◽  
Vol 1118 ◽  
pp. 92-96 ◽  
Author(s):  
Wen Sheng Yu ◽  
Chun Song Zhu ◽  
Qian Li Ma ◽  
Wen Wen Ma ◽  
Jin Xian Wang ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Fluorescence Spectra ◽  
Energy Levels ◽  
Energy Dispersion Spectroscopy ◽  
Spectra Analysis ◽  
Red Emission ◽  
X Ray ◽  
Double Crucible ◽  
Fabrication And Characterization

LaOBr:Eu3+ nanofibers have been successfully fabricated by electrospinning combined with a double-crucible bromination technique using cetyltrimethylammonium bromide (CTAB) powers as bromine source. The products were characterized in detail by X-ray diffractometry (XRD), scanning electron microscopy (SEM), energy dispersion spectroscopy (EDS) and fluorescence spectroscopy. The results indicate that LaOBr:Eu3+ luminescent nanofibers are tetragonal in structure with space group P4/nmm. The diameter of LaOBr:Eu3+ luminescent nanofibers is ca. 150 nm. Fluorescence spectra analysis shows that under the excitation of 302-nm ultraviolet light, the LaOBr:Eu3+ nanofibers exhibit red emission centering at 620 nm, which is attributed to the 5D0→7F2 energy levels transitions of Eu3+ ions.

Strong Polarity and Bond Characterization of Nanostructured Silicon Nitride Solids

1992 ◽  
Vol 286 ◽  
Author(s):  
Lide Zhang ◽  
Chimei Mo ◽  
Tao Wang ◽  
Cunyi Xie
Keyword(s):  
Silicon Nitride ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Bond Properties ◽  
Dielectric Measurements ◽  
X Ray ◽  
Nanostructured Silicon ◽  
Spin Resonance ◽  
Measuring Frequency

ABSTRACTNanostructured silicon nitride solids (NANO–SSNS) were investigated by x–ray photoelectron spectroscopy (XPS), electron spin resonance (ESR) and dielectric measurements. It is found that the dielectric constant of NANO–SSNS depends strongly on the measuring frequency, f. When f<100Hz, at room temperature it is forty times as much as that of conventional Si3N4. ESR measurements show that a large number of unbinding electrons exist in interfaces. This suggests that the NANO–SSNS possess strong polarity. The study on the bond properties indicates that a large number of unsaturated and dangling bonds exist in interfaces of NANO–SSNS.

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