scholarly journals Direct determination of Al content in molecular-beam epitaxially grown AlxGa1−xAs (0≤x≤1) by nuclear resonant reaction analysis and x-ray rocking curve techniques

1988 ◽  
Vol 6 (2) ◽  
pp. 758 ◽  
Author(s):  
Fulin Xiong
Keyword(s):  
Molecular Beam ◽  
Direct Determination ◽  
Rocking Curve ◽  
X Ray ◽  
Al Content ◽  
Resonant Reaction

Direct determination of the wave field of an x-ray nanobeam

2008 ◽  
Vol 77 (1) ◽  
Author(s):  
Hidekazu Mimura ◽  
Hirokatsu Yumoto ◽  
Satoshi Matsuyama ◽  
Soichiro Handa ◽  
Takashi Kimura ◽  
...  
Keyword(s):  
Wave Field ◽  
Direct Determination ◽  
X Ray

Direct Determination of Stress Levels in Sputtered Films by means of X-Ray Diffraction Topographic Method

1987 ◽  
Vol 26 (Part 1, No. 1) ◽  
pp. 157-161 ◽  
Author(s):  
Osamu Nittono ◽  
Yoshihiro Sadamoto ◽  
Sheng Kai Gong
Keyword(s):  
Direct Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputtered Films ◽  
Stress Levels

scholarly journals Влияние толщины пленки Pt на изменение текстуры и доли кристаллической фазы при ее отжиге

2020 ◽  
Vol 90 (5) ◽  
pp. 795
Author(s):  
Р.В. Селюков ◽  
В.В. Наумов
Keyword(s):  
Volume Fraction ◽  
Curve Analysis ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Texture Parameters ◽  
Sputter Deposited ◽  
Pt Films ◽  
H 20

Textured Pt films with thickness h=20-80 nm were sputter deposited on oxidized c-Si (100) wafers and annealed in vacuum at 500°C/60 min. The thickness dependencies of the crystalline texture parameters and of the fraction of crystalline phase δ are obtained for as-deposited and annealed films using X-ray diffraction. The determination of δ in textured films is carried out by the new method based on rocking curve analysis. It is found that annealing leads to the texture improvement and to the increasing of δ for all h. The less h, the stronger effects of texture improvement and of δ increasing. These results are explained by the annealing-induced formation of large secondary grains whose volume fraction increases as h decreases. The inhomogeneity of the depth distributions of texture parameters and of δ are investigated for the as-deposited Pt films.

Direct determination of molecular orbital symmetry ofH2S using polarized x-ray emission

1991 ◽  
Vol 43 (1) ◽  
pp. 235-241 ◽  
Author(s):  
R. Mayer ◽  
D. W. Lindle ◽  
S. H. Southworth ◽  
P. L. Cowan
Keyword(s):  
Molecular Orbital ◽  
Direct Determination ◽  
Orbital Symmetry ◽  
X Ray
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