Direct determination of dislocation sense of closed-core threading screw dislocations using synchrotron white beam x-ray topography in 4H silicon carbide

2007 ◽  
Vol 91 (14) ◽  
pp. 141918 ◽  
Author(s):  
Yi Chen ◽  
Michael Dudley
Keyword(s):  
Silicon Carbide ◽  
Direct Determination ◽  
Screw Dislocations ◽  
X Ray ◽  
White Beam

Sense determination of micropipes via grazing-incidence synchrotron white beam x-ray topography in 4H silicon carbide

2007 ◽  
Vol 91 (7) ◽  
pp. 071917 ◽  
Author(s):  
Y. Chen ◽  
G. Dhanaraj ◽  
M. Dudley ◽  
E. K. Sanchez ◽  
M. F. MacMillan
Keyword(s):  
Silicon Carbide ◽  
Grazing Incidence ◽  
X Ray ◽  
White Beam

Determination of Burgers Vector of Screw Dislocations in 6H-SiC Single Crystals by Synchrotron White Beam X-Ray Topography

1996 ◽  
Vol 437 ◽  
Author(s):  
W. Si ◽  
M. Dudley ◽  
C. Carter ◽  
R. Glass ◽  
V. Tsvetkov
Keyword(s):  
Single Crystals ◽  
Dislocation Core ◽  
Line Defect ◽  
Screw Dislocations ◽  
Burgers Vector ◽  
X Ray ◽  
White Beam ◽  
Lattice Planes ◽  
Vector Magnitude

AbstractIndividual screw dislocations along the [0001] axis in 6H-SiC single crystals have been characterized by means of Synchrotron White Beam X-ray Topography (SWBXT). The magnitude of the Burgers vector was determined from: (1) the diameter of circular diffraction-contrast images of dislocations in back-reflection topographs, (2) the width of bi-modal images associated with screw dislocations in transmission topographs, (3) the magnitude of the tilt of the lattice planes on both sides of dislocation core in projection topographs, and (4) also the magnitude of the tilt of the lattice planes in section topographs. All of the four methods showed reasonable consistency. The sense of the Burgers vector can also be deduced from the abovementioned tilt of the lattice planes. Results revealed that in 6H-SiC a variety of screw dislocations can be found with Burgers vector magnitude ranging from 1c to 7c (c is the lattice constant along [0001] axis). This work demonstrates that SWBXT can be used as a quantitative technique for detailed analyses of line defect configurations.

Direct determination of the wave field of an x-ray nanobeam

2008 ◽  
Vol 77 (1) ◽  
Author(s):  
Hidekazu Mimura ◽  
Hirokatsu Yumoto ◽  
Satoshi Matsuyama ◽  
Soichiro Handa ◽  
Takashi Kimura ◽  
...  
Keyword(s):  
Wave Field ◽  
Direct Determination ◽  
X Ray

Direct Determination of Stress Levels in Sputtered Films by means of X-Ray Diffraction Topographic Method

1987 ◽  
Vol 26 (Part 1, No. 1) ◽  
pp. 157-161 ◽  
Author(s):  
Osamu Nittono ◽  
Yoshihiro Sadamoto ◽  
Sheng Kai Gong
Keyword(s):  
Direct Determination ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputtered Films ◽  
Stress Levels
Sign in / Sign up

Export Citation Format

Share Document