Thin-film crystallography using reflection high-energy electron diffraction ‘‘rod intensity profiles’’: Ni/Si(111)
1988 ◽
Vol 6
(4)
◽
pp. 1336
◽
2011 ◽
pp. 180-211
◽
Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
◽
Keyword(s):
1987 ◽
Vol 5
(4)
◽
pp. 2027-2028
◽
Keyword(s):
Keyword(s):
Keyword(s):
1995 ◽
Vol 114
(1)
◽
pp. 190-198
◽
Keyword(s):
Keyword(s):
Keyword(s):
1976 ◽
Vol 47
(5)
◽
pp. 542-544
◽
Keyword(s):