Thin-film crystallography using reflection high-energy electron diffraction ‘‘rod intensity profiles’’: Ni/Si(111)

Author(s):  
P. A. Bennett
1995 ◽  
Vol 114 (1) ◽  
pp. 190-198 ◽  
Author(s):  
A. Gupta ◽  
T.M. Shaw ◽  
M.Y. Chern ◽  
B.W. Hussey ◽  
A.M. Guloy ◽  
...  

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