In situ thin film and multilayer structural characterization using x-ray fluorescence induced by reflection high energy electron diffraction

2009 ◽  
Vol 106 (2) ◽  
pp. 024308 ◽  
Author(s):  
Sandeep Chandril ◽  
Cameron Keenan ◽  
T. H. Myers ◽  
David Lederman
Keyword(s):  
Thin Film ◽  
Electron Diffraction ◽  
Structural Characterization ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray

In-situ stoichiometry determination using x-ray fluorescence generated by reflection-high-energy-electron-diffraction

2011 ◽  
Vol 109 (11) ◽  
pp. 114305 ◽  
Author(s):  
Cameron Keenan ◽  
Sandeep Chandril ◽  
T. H. Myers ◽  
David Lederman
Keyword(s):  
Electron Diffraction ◽  
High Energy ◽  
Energy Electron ◽  
High Energy Electron ◽  
X Ray

scholarly journals Complex oxide growth using simultaneous in situ reflection high-energy electron diffraction and x-ray reflectivity: When is one layer complete?

2015 ◽  
Vol 106 (3) ◽  
pp. 031604 ◽  
Author(s):  
M. C. Sullivan ◽  
M. J. Ward ◽  
Araceli Gutiérrez-Llorente ◽  
Eli R. Adler ◽  
H. Joress ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Complex Oxide ◽  
High Energy ◽  
Energy Electron ◽  
Oxide Growth ◽  
High Energy Electron ◽  
X Ray
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