Study of substrate bias effect on corrosion susceptibility of thin film magnetic disks by accelerated chemical tests

1998 ◽  
Vol 16 (3) ◽  
pp. 1745-1749 ◽  
Author(s):  
Charles C. Wang ◽  
Ray W. J. Chia ◽  
Jerry K. Lee ◽  
Wing T. Tang
Keyword(s):  
Thin Film ◽  
Substrate Bias ◽  
Bias Effect ◽  
Magnetic Disks ◽  
Corrosion Susceptibility

Substrate bias effect on Al–Si and Al–Ge thin film structure

2008 ◽  
Vol 516 (23) ◽  
pp. 8315-8318 ◽  
Author(s):  
Ryoko Horie ◽  
Nobuhiro Yasui ◽  
Yoshihiro Ohashi ◽  
Tohru Den
Keyword(s):  
Thin Film ◽  
Film Structure ◽  
Substrate Bias ◽  
Bias Effect ◽  
Thin Film Structure

A Substrate Bias Effect on Recovery of the Threshold Voltage Shift of Amorphous Silicon Thin-Film Transistors

2007 ◽  
Vol 46 (7A) ◽  
pp. 4042-4045 ◽  
Author(s):  
Chang-Wook Han ◽  
Min-Koo Han ◽  
Nack-Bong Choi ◽  
Chang-Dong Kim ◽  
Ki-Yong Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Substrate Bias ◽  
Silicon Thin Film ◽  
Bias Effect ◽  
Threshold Voltage Shift ◽  
Voltage Shift

Growth kinetics of Al2Cu in an Al-1.5Cu thin film by in Situ TEM

1993 ◽  
Vol 51 ◽  
pp. 1172-1173
Author(s):  
M. Park ◽  
S.J. Krause ◽  
S.R. Wilson
Keyword(s):  
Thin Film ◽  
In Situ Tem ◽  
Collector Plate ◽  
Transmission Electron ◽  
Device Processing ◽  
Corrosion Susceptibility ◽  
Precipitation Phenomena ◽  
Semiconductor Chips ◽  
Kinetics Of

Cu alloying in Al interconnection lines on semiconductor chips improves their resistance to electromigration and hillock growth. Excess Cu in Al can result in the formation of Cu-rich Al2Cu (θ) precipitates. These precipitates can significantly increase corrosion susceptibility due to the galvanic action between the θ-phase and the adjacent Cu-depleted matrix. The size and distribution of the θ-phase are also closely related to the film susceptibility to electromigration voiding. Thus, an important issue is the precipitation phenomena which occur during thermal device processing steps. In bulk alloys, it was found that the θ precipitates can grow via the grain boundary “collector plate mechanism” at rates far greater than allowed by volume diffusion. In a thin film, however, one might expect that the growth rate of a θ precipitate might be altered by interfacial diffusion. In this work, we report on the growth (lengthening) kinetics of the θ-phase in Al-Cu thin films as examined by in-situ isothermal aging in transmission electron microscopy (TEM).

Corrosion of Electronic and Magnetic Devices and Materials

1996 ◽  
Vol 451 ◽  
Author(s):  
Gerald S. Frankel
Keyword(s):  
Thin Film ◽  
Failure Modes ◽  
Galvanic Corrosion ◽  
Potential Drop ◽  
Magnetic Devices ◽  
Disk Structure ◽  
Magnetic Layers ◽  
Ohmic Potential Drop ◽  
Corrosion Problem ◽  
Corrosion Susceptibility

ABSTRACTCorrosion of thin film structures commonly used in electronic and magnetic devices is discussed. Typical failure modes are presented, and galvanic corrosion is discussed in some detail since it is one common problem with such devices. A graphical explanation for the determination of the ohmic potential drop during galvanic corrosion is presented. The corrosion problem of thin film disks is shown to have changed during the past ten years owing to changes in disk structure. The corrosion susceptibility of two antiferromagnetic alloys used for exchange coupling to soft magnetic layers is discussed.

Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization

2017 ◽  
Vol 178 ◽  
pp. 17-20 ◽  
Author(s):  
Rodrigo Trevisoli Doria ◽  
Renan Trevisoli ◽  
Michelly de Souza ◽  
Sylvain Barraud ◽  
Maud Vinet ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Substrate Bias ◽  
Low Frequency Noise ◽  
Bias Effect ◽  
Nanowire Transistors ◽  
Noise Characterization

Tribological implications of solvents in dip-coating lubrication of thin film magnetic disks

1996 ◽  
Vol 32 (5) ◽  
pp. 3699-3701 ◽  
Author(s):  
C. Gao ◽  
Y.C. Lee ◽  
J. Chao ◽  
M. Russak
Keyword(s):  
Thin Film ◽  
Dip Coating ◽  
Magnetic Disks

Effect of argon and substrate bias on diamond thin film surface morphology

Vacuum ◽  
2007 ◽  
Vol 82 (2) ◽  
pp. 154-157 ◽  
Author(s):  
M. Marton ◽  
T. Ižák ◽  
M. Veselý ◽  
M. Vojs ◽  
M. Michalka ◽  
...  
Keyword(s):  
Thin Film ◽  
Surface Morphology ◽  
Film Surface ◽  
Substrate Bias ◽  
Thin Film Surface ◽  
Diamond Thin Film

Giant exchange bias effect in all-3d-metal Ni38.8Co2.9Mn37.9Ti20.4 thin film

2020 ◽  
Vol 116 (2) ◽  
pp. 022412
Author(s):  
K. Liu ◽  
S. C. Ma ◽  
Z. S. Zhang ◽  
X. W. Zhao ◽  
B. Yang ◽  
...  
Keyword(s):  
Thin Film ◽  
Exchange Bias ◽  
Bias Effect ◽  
Exchange Bias Effect
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