Visualization of a buried organic interface by imaging time‐of‐flight secondary ion mass spectrometry and scanning Auger microprobe of an ion‐beam crater edge

1996 ◽  
Vol 14 (4) ◽  
pp. 2289-2302 ◽  
Author(s):  
Patrick C. Schamberger ◽  
Gary L. Jones ◽  
Joseph A. Gardella ◽  
Patrick J. McKeown ◽  
Larry E. Davis
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Time Of Flight ◽  
Imaging Time ◽  
Scanning Auger Microprobe ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Exchange of Fluorinated Cyanine Dyes between Different Types of Silver Halide Microcrystals Studied by Imaging Time-of-Flight Secondary Ion Mass Spectrometry

Langmuir ◽  
2001 ◽  
Vol 17 (23) ◽  
pp. 7332-7338 ◽  
Author(s):  
Jens Lenaerts ◽  
Geert Verlinden ◽  
Luc Van Vaeck ◽  
Renaat Gijbels ◽  
Ingrid Geuens ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Silver Halide ◽  
Time Of Flight ◽  
Cyanine Dyes ◽  
Imaging Time ◽  
Different Types ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Imaging of Membrane Lipids in Single Cells by Imprint-Imaging Time-of-Flight Secondary Ion Mass Spectrometry

2003 ◽  
Vol 75 (14) ◽  
pp. 3429-3434 ◽  
Author(s):  
Peter Sjövall ◽  
Jukka Lausmaa ◽  
Håkan Nygren ◽  
Lennart Carlsson ◽  
Per Malmberg
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Membrane Lipids ◽  
Single Cells ◽  
Time Of Flight ◽  
Imaging Time ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Peak picking as a pre-processing technique for imaging time of flight secondary ion mass spectrometry

2012 ◽  
Vol 45 (1) ◽  
pp. 461-465 ◽  
Author(s):  
Jimmy D. Moore ◽  
Alex Henderson ◽  
John S. Fletcher ◽  
Nicholas P. Lockyer ◽  
John C. Vickerman
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Processing Technique ◽  
Peak Picking ◽  
Imaging Time ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

A C60Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

2003 ◽  
Vol 75 (7) ◽  
pp. 1754-1764 ◽  
Author(s):  
Daniel Weibel ◽  
Steve Wong ◽  
Nicholas Lockyer ◽  
Paul Blenkinsopp ◽  
Rowland Hill ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Time Of Flight ◽  
Beam System ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Detection of ZrO2 Nanoparticles in Lung Tissue Sections by Time-of-Flight Secondary Ion Mass Spectrometry and Ion Beam Microscopy

Nanomaterials ◽  
2018 ◽  
Vol 8 (1) ◽  
pp. 44 ◽  
Author(s):  
Lothar Veith ◽  
Julia Böttner ◽  
Antje Vennemann ◽  
Daniel Breitenstein ◽  
Carsten Engelhard ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Lung Tissue ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Time Of Flight ◽  
Zro2 Nanoparticles ◽  
Tissue Sections ◽  
Ion Mass Spectrometry ◽  
Secondary Ion
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