In situ observations of Ge(001) and Ge/Si(001) using low‐energy ion scattering

1994 ◽  
Vol 12 (6) ◽  
pp. 3012-3017 ◽  
Author(s):  
W. T. Taferner ◽  
A. Freundlich ◽  
A. Bensaoula ◽  
A. Ignatiev ◽  
Kelley Waters ◽  
...  
Keyword(s):  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
In Situ Observations

In-Situ Measurement ofHe+Stopping in Si Layers by Low-Energy Ion-Scattering Spectroscopy

1996 ◽  
Vol 35 (Part 1, No. 3) ◽  
pp. 1937-1939 ◽  
Author(s):  
Miyako Matsui ◽  
Fumihiko Uchida ◽  
Kiyokazu Nakagawa ◽  
Akio Nishida
Keyword(s):  
Low Energy ◽  
In Situ Measurement ◽  
Ion Scattering ◽  
Low Energy Ion Scattering ◽  
Ion Scattering Spectroscopy

In situ surface analysis by low energy ion scattering

2000 ◽  
Vol 161-163 ◽  
pp. 56-64 ◽  
Author(s):  
A.W Denier van der Gon ◽  
R Cortenraad ◽  
W.P.A Jansen ◽  
M.A Reijme ◽  
H.H Brongersma
Keyword(s):  
Surface Analysis ◽  
Low Energy ◽  
Ion Scattering ◽  
Low Energy Ion Scattering
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