Dependence of etch characteristics on charge particles as measured by Langmuir probe in a multipolar electron cyclotron resonance source

1994 ◽  
Vol 12 (1) ◽  
pp. 69-74 ◽  
Author(s):  
K. T. Sung ◽  
W. H. Juan ◽  
S. W. Pang ◽  
M. Dahimene
1998 ◽  
Vol 72 (12) ◽  
pp. 1448-1450 ◽  
Author(s):  
F. Delmotte ◽  
M. C. Hugon ◽  
B. Agius ◽  
A. M. Pointu ◽  
S. Teodoru

2005 ◽  
Vol 34 (6) ◽  
pp. 733-739 ◽  
Author(s):  
A. J. Stoltz ◽  
M. J. Sperry ◽  
J. D. Benson ◽  
J. B. Varesi ◽  
M. Martinka ◽  
...  

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