Chemical interaction of thin Cr films with the MoS2(0001) surface studied by x‐ray photoelectron spectroscopy and scanning Auger microscopy

1992 ◽  
Vol 10 (4) ◽  
pp. 2529-2534 ◽  
Author(s):  
Thomas D. Durbin ◽  
Jeffrey R. Lince ◽  
Jory A. Yarmoff
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Interaction ◽  
X Ray ◽  
Scanning Auger Microscopy ◽  
Auger Microscopy

scholarly journals Scanning Auger Microscopy Studies of Silane Films Grown on Plasma-Modified HOPG Surfaces

Polymers ◽  
2019 ◽  
Vol 11 (2) ◽  
pp. 307
Author(s):  
Jade K. Taylor ◽  
Jasmine R. Wiese ◽  
Sarah L. Harmer ◽  
Jamie S. Quinton
Keyword(s):  
Photoelectron Spectroscopy ◽  
Film Growth ◽  
Pyrolytic Graphite ◽  
Chemical Deposition ◽  
X Ray ◽  
Scanning Auger Microscopy ◽  
Deposition Parameters ◽  
Covalently Bonded ◽  
Wet Chemical ◽  
Auger Microscopy

The growth of silane films on plasma oxidized highly oriented pyrolytic graphite (HOPG) surfaces has been studied using wet chemical deposition of propyltrimethoxysilane (PTMS) and propyldimethylmethoxysilane (PDMMS). Scanning Auger microscopy (SAM) and X-ray photoelectron spectroscopy (XPS) were used to investigate the chemical composition and morphology of the silane films. The effects of several deposition parameters were examined, including the necessity of oxidation of the HOPG surface, addition of water with the silane, and rinsing before curing. The optimal conditions needed to create a complete uniform film differ for the two silanes due to differences in their structures. Both silanes require an oxidized HOPG surface for a film to grow, the addition of water with PTMS results in a thicker film, while the addition of water with PDMMS decreases the film growth. Rinsing of both samples before curing removes physisorbed species, leaving only the covalently bonded film on the surface.

Scanning Auger microscopy and x‐ray photoelectron spectroscopy studies of Roman bronzes

1995 ◽  
Vol 13 (3) ◽  
pp. 1229-1233 ◽  
Author(s):  
E. Paparazzo ◽  
L. Moretto ◽  
J. P. Northover ◽  
C. D’Amato ◽  
A. Palmieri
Keyword(s):  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Scanning Auger Microscopy ◽  
Spectroscopy Studies ◽  
Auger Microscopy

New insights into the characterization of the electrode/electrolyte interfaces within LiMn2O4/Li4Ti5O12 cells, by X-ray photoelectron spectroscopy, scanning Auger microscopy and time-of-flight secondary ion mass spectrometry

2017 ◽  
Vol 5 (29) ◽  
pp. 15315-15325 ◽  
Author(s):  
Jean-Baptiste Gieu ◽  
Volker Winkler ◽  
Cécile Courrèges ◽  
Loubna El Ouatani ◽  
Cécile Tessier ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Scanning Auger Microscopy ◽  
Ion Mass Spectrometry ◽  
Auger Microscopy ◽  
Secondary Ion

This work aims to study the electrode/electrolyte interfaces in a Li4Ti5O12 (LTO)/LiMn2O4 (LMO) cell assembled with a VC-containing electrolyte and operating at 60 °C.

Sign in / Sign up

Export Citation Format

Share Document