Infrared absorption and x‐ray photoelectron spectroscopy studies of the anodic oxidation of plasma silicon nitride

1991 ◽  
Vol 9 (4) ◽  
pp. 2285-2288
Author(s):  
I. Montero ◽  
L. Galán ◽  
J. C. Pivin ◽  
O. Sánchez ◽  
J. M. Albella
Keyword(s):  
Silicon Nitride ◽  
Anodic Oxidation ◽  
Infrared Absorption ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Spectroscopy Studies

X-ray photoelectron spectroscopy studies of laterite standard reference material

2005 ◽  
Vol 228 (1-2) ◽  
pp. 151-162 ◽  
Author(s):  
J. Mendialdua ◽  
R. Casanova ◽  
F. Rueda ◽  
A. Rodríguez ◽  
J. Quiñones ◽  
...  
Keyword(s):  
Reference Material ◽  
Standard Reference Material ◽  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Spectroscopy Studies

scholarly journals Термодинамические свойства оксипентафторида ванадия (IV), (NH-=SUB=-4-=/SUB=-)-=SUB=-3-=/SUB=-VOF-=SUB=-5-=/SUB=-

2020 ◽  
Vol 62 (7) ◽  
pp. 1123
Author(s):  
Е.В. Богданов ◽  
Е.И. Погорельцев ◽  
А.В. Карташев ◽  
М.В. Горев ◽  
М.С. Молокеев ◽  
...  
Keyword(s):  
Phase Transitions ◽  
Photoelectron Spectroscopy ◽  
Single Phase ◽  
Dielectric Studies ◽  
X Ray Diffraction ◽  
X Ray ◽  
Limits Of Stability ◽  
Three Phase ◽  
Temperature Dependences ◽  
Spectroscopy Studies

Abstract The (NH_4)_3VOF_5 crystals have been synthesized and their homogeneity and single-phase structure has been established by the X-ray diffraction, energy dispersive spectroscopy, and X-ray photoelectron spectroscopy studies. The investigations of the temperature dependences of specific heat, entropy, strain, and pressure susceptibility show the occurrence of three phase transitions caused by the structural transformations in the (NH_4)_3VOF_5 crystals. The T – p phase diagram shows the temperature limits of stability of the crystalline phases implemented in (NH_4)_3VOF_5. The optical and dielectric studies disclose the ferroelastic nature of the phase transitions. An analysis of the experimental data together with the data on the isostructural (NH_4)_3VO_2F_4 crystal makes it possible to distinguish the physical properties of oxyfluorides containing vanadium of different valences (IV and V).

scholarly journals X-Ray Photoelectron Spectroscopy Studies of Pd Supported MgO/Mg

2009 ◽  
Vol 18 (4) ◽  
pp. 281-287 ◽  
Author(s):  
Wei-Sheng Tai ◽  
Hyun-Ook Seo ◽  
Kwang-Dae Kim ◽  
Young-Dok Kim
Keyword(s):  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Spectroscopy Studies
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