Summary Abstract: Surface characterization of corrosion processes in FeTb alloy thin films

1988 ◽  
Vol 6 (3) ◽  
pp. 1863-1864 ◽  
Author(s):  
Kurt F. Stork ◽  
Neal R. Armstrong ◽  
Paul A. Lee
Keyword(s):  
Thin Films ◽  
Surface Characterization

Surface Characterization of Antireflective Thin Films

2012 ◽  
Vol 9 (9) ◽  
pp. 1255-1259
Author(s):  
Janina Setina ◽  
Gundars Mezinskis ◽  
Daina Andersone
Keyword(s):  
Thin Films ◽  
Surface Characterization

Surface Characterization of YBCO Thin Films by LEED, XPS and ISS

1993 ◽  
pp. 833-836 ◽  
Author(s):  
Takao Nakamura ◽  
So Tanaka ◽  
Hitoki Tokuda ◽  
Michitomo Iiyama
Keyword(s):  
Thin Films ◽  
Surface Characterization ◽  
Ybco Thin Films

Surface characterization of sputtered N:TiO2 thin films within a wide range of dopant concentration

2014 ◽  
Vol 40 (7) ◽  
pp. 9989-9995 ◽  
Author(s):  
A.V. Manole ◽  
M. Dobromir ◽  
R. Apetrei ◽  
V. Nica ◽  
D. Luca
Keyword(s):  
Thin Films ◽  
Surface Characterization ◽  
Dopant Concentration ◽  
Wide Range

Surface characterization of TTF-TCNQ thin films evaporated on alkali halide substrates

1999 ◽  
Vol 102 (1-3) ◽  
pp. 1607-1608 ◽  
Author(s):  
J. Caro ◽  
J. Fraxedas ◽  
J. Santiso ◽  
A. Figueras ◽  
P. Gorostiza ◽  
...  
Keyword(s):  
Thin Films ◽  
Alkali Halide ◽  
Surface Characterization

Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

2004 ◽  
Vol 20-21 ◽  
pp. 611-616
Author(s):  
José M. Barandiarán ◽  
Iñaki Orue ◽  
M.L. Fdez-Gubieda ◽  
A. García Prieto
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Force Microscopy ◽  
Atomic Force

Surface characterization of superconductive Nd 1 Ba 2 Cu 3 O y thin films using scanning probe microscopes

1996 ◽  
Author(s):  
Ting Wu ◽  
Massoud Badaye ◽  
R. Itti ◽  
Tadataka Morishita ◽  
N. Koshizuka ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Characterization ◽  
Scanning Probe

Surface Characterization Of Chromium Oxide Thin Films in Dependence on CVD Growth Process Parameters

2019 ◽  
Vol 2 (7) ◽  
pp. 229-236 ◽  
Author(s):  
Kostadinka A. Gesheva ◽  
Tatyana Ivanova ◽  
Anna Maria Szekeres ◽  
Oleg Trofimov
Keyword(s):  
Thin Films ◽  
Chromium Oxide ◽  
Process Parameters ◽  
Surface Characterization ◽  
Growth Process ◽  
Oxide Thin Films ◽  
Cvd Growth
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