Surface Characterization Of Chromium Oxide Thin Films in Dependence on CVD Growth Process Parameters

Kostadinka A. Gesheva; Tatyana Ivanova; Anna Maria Szekeres; Oleg Trofimov

doi:10.1149/1.2408917

Surface Characterization Of Chromium Oxide Thin Films in Dependence on CVD Growth Process Parameters

ECS Transactions ◽

10.1149/1.2408917 ◽

2019 ◽

Vol 2 (7) ◽

pp. 229-236 ◽

Cited By ~ 1

Author(s):

Kostadinka A. Gesheva ◽

Tatyana Ivanova ◽

Anna Maria Szekeres ◽

Oleg Trofimov

Keyword(s):

Thin Films ◽

Chromium Oxide ◽

Process Parameters ◽

Surface Characterization ◽

Growth Process ◽

Oxide Thin Films ◽

Cvd Growth

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Surface Characterization Of Chromium Oxide Thin Films In Dependence On CVD Growth Process Parameters

ECS Meeting Abstracts ◽

10.1149/ma2006-01/23/813 ◽

2006 ◽

Keyword(s):

Thin Films ◽

Chromium Oxide ◽

Process Parameters ◽

Surface Characterization ◽

Growth Process ◽

Oxide Thin Films ◽

Cvd Growth

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Characterization of sputter-deposited chromium oxide thin films

Surface and Coatings Technology ◽

10.1016/s0257-8972(99)00384-9 ◽

1999 ◽

Vol 120-121 ◽

pp. 277-283 ◽

Cited By ~ 121

Author(s):

P. Hones ◽

M. Diserens ◽

F. Lévy

Keyword(s):

Thin Films ◽

Chromium Oxide ◽

Oxide Thin Films ◽

Sputter Deposited

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Microstructural characterization of chromium oxide thin films grown by remote plasma assisted pulsed laser deposition

Journal of Physics Conference Series ◽

10.1088/1742-6596/59/1/128 ◽

2007 ◽

Vol 59 ◽

pp. 600-604 ◽

Cited By ~ 14

Author(s):

C Madi ◽

M Tabbal ◽

T Christidis ◽

S Isber ◽

B Nsouli ◽

...

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Chromium Oxide ◽

Pulsed Laser ◽

Microstructural Characterization ◽

Laser Deposition ◽

Oxide Thin Films ◽

Remote Plasma

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Growth and characterization of chromium oxide thin films prepared by reactive ac magnetron sputtering

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.2244536 ◽

2006 ◽

Vol 24 (5) ◽

pp. 1870-1877 ◽

Cited By ~ 10

Author(s):

Atul Khanna ◽

Deepak G. Bhat ◽

E. A. Payzant

Keyword(s):

Thin Films ◽

Magnetron Sputtering ◽

Chromium Oxide ◽

Oxide Thin Films

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Structural, mechanical and tribological characterization of chromium oxide thin films prepared by post-annealing of Cr thin films

Applied Surface Science ◽

10.1016/j.apsusc.2013.07.123 ◽

2013 ◽

Vol 284 ◽

pp. 489-496 ◽

Cited By ~ 13

Author(s):

K. Khojier ◽

H. Savaloni ◽

Z. Ashkabusi ◽

N.Z. Dehnavi

Keyword(s):

Thin Films ◽

Chromium Oxide ◽

Oxide Thin Films ◽

Post Annealing ◽

Tribological Characterization

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Indium-Tin-Oxide Thin Films for Characterization of Electrochemical Processes in Molecular Assemblies Surface Characterization and Surface Modification

Conjugated Polymer And Molecular Interfaces ◽

10.1201/9780203910870-12 ◽

2001 ◽

pp. 285-308

Keyword(s):

Thin Films ◽

Surface Modification ◽

Tin Oxide ◽

Indium Tin Oxide ◽

Surface Characterization ◽

Oxide Thin Films ◽

Molecular Assemblies ◽

Electrochemical Processes

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Characterization of CVD Chromium Oxide Thin Films

phys stat sol (a) ◽

10.1002/1521-396x(200104)184:2<507::aid-pssa507>3.0.co;2-o ◽

2001 ◽

Vol 184 (2) ◽

pp. 507-513 ◽

Cited By ~ 15

Author(s):

T. Ivanova ◽

M. Surtchev ◽

K. Gesheva

Keyword(s):

Thin Films ◽

Chromium Oxide ◽

Oxide Thin Films

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Surface characterization of radio frequency water plasma treated and annealed polycrystalline tin oxide thin films

Chemistry of Materials ◽

10.1021/cm00007a008 ◽

1990 ◽

Vol 2 (1) ◽

pp. 49-60 ◽

Cited By ~ 12

Author(s):

Michael J. Tarlov ◽

John F. Evans

Keyword(s):

Thin Films ◽

Radio Frequency ◽

Tin Oxide ◽

Surface Characterization ◽

Oxide Thin Films

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Indium-Tin-Oxide Thin Films for Characterization of Electrochemical Processes in Molecular Assemblies Surface Characterization and Surface Modification

Conjugated Polymer And Molecular Interfaces ◽

10.1201/9780203910870.ch9 ◽

2001 ◽

Author(s):

Carrie Donley ◽

Darren Dunphy ◽

Rebecca Zangmeister ◽

Kenneth Nebesny ◽

Neal Armstrong

Keyword(s):

Thin Films ◽

Surface Modification ◽

Tin Oxide ◽

Indium Tin Oxide ◽

Surface Characterization ◽

Oxide Thin Films ◽

Molecular Assemblies ◽

Electrochemical Processes

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The modification of ferroelectric LiNbO3(0001) surfaces using chromium oxide thin films

Physical Chemistry Chemical Physics ◽

10.1039/c4cp05875e ◽

2015 ◽

Vol 17 (14) ◽

pp. 9488-9498 ◽

Cited By ~ 10

Author(s):

M. W. Herdiech ◽

X. Zhu ◽

M. D. Morales-Acosta ◽

F. J. Walker ◽

E. I. Altman

Keyword(s):

Thin Films ◽

Chromium Oxide ◽

Charge Compensation ◽

Oxide Surface ◽

Oxide Thin Films ◽

Compensation Layer

Illustration showing non-polar Cr2O3 deposition onto ferroelectric LiNbO3. Characterization of the interface suggests that the charge compensation layer migrates to the chromium oxide surface where it can lead to distinct chemistry on oppositely poled substrates.

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