Surface characterization of superconductive Nd 1 Ba 2 Cu 3 O y thin films using scanning probe microscopes

1996 ◽  
Author(s):  
Ting Wu ◽  
Massoud Badaye ◽  
R. Itti ◽  
Tadataka Morishita ◽  
N. Koshizuka ◽  
...  
Keyword(s):  
Thin Films ◽  
Surface Characterization ◽  
Scanning Probe

Surface Characterization of Antireflective Thin Films

2012 ◽  
Vol 9 (9) ◽  
pp. 1255-1259
Author(s):  
Janina Setina ◽  
Gundars Mezinskis ◽  
Daina Andersone
Keyword(s):  
Thin Films ◽  
Surface Characterization

Surface Characterization of YBCO Thin Films by LEED, XPS and ISS

1993 ◽  
pp. 833-836 ◽  
Author(s):  
Takao Nakamura ◽  
So Tanaka ◽  
Hitoki Tokuda ◽  
Michitomo Iiyama
Keyword(s):  
Thin Films ◽  
Surface Characterization ◽  
Ybco Thin Films

Surface characterization of sputtered N:TiO2 thin films within a wide range of dopant concentration

2014 ◽  
Vol 40 (7) ◽  
pp. 9989-9995 ◽  
Author(s):  
A.V. Manole ◽  
M. Dobromir ◽  
R. Apetrei ◽  
V. Nica ◽  
D. Luca
Keyword(s):  
Thin Films ◽  
Surface Characterization ◽  
Dopant Concentration ◽  
Wide Range

Growth and Characterization of Chalcopyrite Nanocrystals: Beyond Conventional Thin Films

2007 ◽  
Vol 1012 ◽  
Author(s):  
David Fuertes Marrón ◽  
Sebastian Lehmann ◽  
Justyna Kosk ◽  
Sascha Sadewasser ◽  
Martha Ch. Lux-Steiner
Keyword(s):  
Thin Films ◽  
Material Characterization ◽  
Processing Parameters ◽  
Scanning Probe ◽  
Vapor Liquid Solid ◽  
Embedded Structures ◽  
Solid Substrates ◽  
Growth Method ◽  
Chalcogenide Compound

AbstractA dry method for the growth of highly-structured Cu-containing chalcopyrite material on solid substrates, based on the use of metallic precursors, is described. Nanocrystals, sub-micrometer polycrystalline dots, and macroscopic clusters have be grown, either as isolated units or alternatively as embedded structures in a matrix of a binary chalcogenide compound, by adjusting processing parameters. Vapor-liquid-solid (VLS) induced growth has been used for the growth of chalcopyrite nanowires. Examples of material characterization by scanning probe techniques are shown, demonstrating the suitability of the proposed growth method.

Surface characterization of TTF-TCNQ thin films evaporated on alkali halide substrates

1999 ◽  
Vol 102 (1-3) ◽  
pp. 1607-1608 ◽  
Author(s):  
J. Caro ◽  
J. Fraxedas ◽  
J. Santiso ◽  
A. Figueras ◽  
P. Gorostiza ◽  
...  
Keyword(s):  
Thin Films ◽  
Alkali Halide ◽  
Surface Characterization

Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

2004 ◽  
Vol 20-21 ◽  
pp. 611-616
Author(s):  
José M. Barandiarán ◽  
Iñaki Orue ◽  
M.L. Fdez-Gubieda ◽  
A. García Prieto
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Force Microscopy ◽  
Atomic Force
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