Summary Abstract: The role of low‐energy ion bombardment during the growth of epitaxial TiN(100) films by reactive magnetron sputtering: Defect formation and annihilation
1987 ◽
Vol 5
(4)
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pp. 2162-2164
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2012 ◽
Vol 27
(5)
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pp. 765-779
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1988 ◽
Vol 92
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pp. 639-656
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2011 ◽
Vol 406
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pp. 2658-2662
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2019 ◽
Vol 801
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pp. 112-122
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