X‐ray photoelectron spectroscopy studies of thin films of TiNx having different annealing histories

Nurit Kaufherr; David Lichtman

doi:10.1116/1.572953

X‐ray photoelectron spectroscopy studies of thin films of TiNx having different annealing histories

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.572953 ◽

1985 ◽

Vol 3 (5) ◽

pp. 1969-1972 ◽

Cited By ~ 22

Author(s):

Nurit Kaufherr ◽

David Lichtman

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Spectroscopy Studies

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X-ray photoelectron spectroscopy studies the cation valencies and distributions in crednerite-Cu1.1Mn0.9O2 thin films

Journal of Alloys and Compounds ◽

10.1016/j.jallcom.2014.02.018 ◽

2014 ◽

Vol 598 ◽

pp. 23-26 ◽

Cited By ~ 12

Author(s):

Hong-Ying Chen ◽

Da-Je Hsu

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Spectroscopy Studies

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Preparation and X-ray photoelectron spectroscopy studies of ZnGa 2 O 4 thin films

Surfaces and Interfaces ◽

10.1016/j.surfin.2018.01.001 ◽

2018 ◽

Vol 10 ◽

pp. 129-135 ◽

Cited By ~ 3

Author(s):

Nanan Li ◽

Pengfei Zhu ◽

Yang Chen ◽

Xiulan Duan ◽

Fapeng Yu

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Spectroscopy Studies

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X-ray photoelectron spectroscopy studies on the bonding properties of oxygenated amorphous carbon nitride thin films synthesized by pulsed laser deposition at different substrate temperatures

Journal of Non-Crystalline Solids ◽

10.1016/j.jnoncrysol.2005.09.020 ◽

2005 ◽

Vol 351 (49-51) ◽

pp. 3738-3746 ◽

Cited By ~ 11

Author(s):

M. Rusop ◽

T. Soga ◽

T. Jimbo

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Carbon Nitride ◽

Pulsed Laser ◽

Laser Deposition ◽

X Ray ◽

Bonding Properties ◽

Amorphous Carbon Nitride ◽

Spectroscopy Studies ◽

Substrate Temperatures

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X-ray, reflection high electron energy diffraction and X-ray photoelectron spectroscopy studies of InSe and γ-In2Se3 thin films grown by molecular beam deposition

Thin Solid Films ◽

10.1016/0040-6090(94)90275-5 ◽

1994 ◽

Vol 237 (1-2) ◽

pp. 291-296 ◽

Cited By ~ 22

Author(s):

L. Brahim-Otsmane ◽

J.-Y. Emery ◽

M. Eddrief

Keyword(s):

Thin Films ◽

Electron Energy ◽

Photoelectron Spectroscopy ◽

Molecular Beam ◽

High Electron ◽

X Ray ◽

Molecular Beam Deposition ◽

Spectroscopy Studies ◽

Beam Deposition

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X‐ray photoelectron spectroscopy studies ofn‐type bismuth‐modified amorphous thin films of Ge20Se80and As2Se3

Journal of Applied Physics ◽

10.1063/1.351638 ◽

1992 ◽

Vol 72 (5) ◽

pp. 2066-2068 ◽

Cited By ~ 6

Author(s):

Sunil Kumar ◽

Subhash C. Kashyap ◽

K. L. Chopra

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Amorphous Thin Films ◽

Spectroscopy Studies

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X-ray photoelectron spectroscopy studies on AlN thin films grown by ion beam sputtering in reactive assistance of N+/N2+ ions: Substrate temperature induced compositional variations

Thin Solid Films ◽

10.1016/j.tsf.2017.07.006 ◽

2017 ◽

Vol 636 ◽

pp. 626-633 ◽

Cited By ~ 8

Author(s):

Neha Sharma ◽

S. Ilango ◽

S. Dash ◽

A.K. Tyagi

Keyword(s):

Thin Films ◽

Substrate Temperature ◽

Photoelectron Spectroscopy ◽

Ion Beam ◽

Ion Beam Sputtering ◽

X Ray ◽

Beam Sputtering ◽

Compositional Variations ◽

Spectroscopy Studies

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Deposition and X-ray photoelectron spectroscopy studies on sputtered cerium dioxide thin films

Proceedings of SOUTHEASTCON '96 ◽

10.1109/secon.1996.510156 ◽

2002 ◽

Author(s):

K.B. Sundaram ◽

P.F. Wahid ◽

O. Melendez

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Cerium Dioxide ◽

X Ray ◽

Spectroscopy Studies

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X-Ray and ultraviolet photoelectron spectroscopy studies of Uranium(iv),(v) and(vi) exposed to H2O-plasma under UHV conditions

Dalton Transactions ◽

10.1039/d0dt03562a ◽

2021 ◽

Author(s):

Ghada El Jamal ◽

Thomas Gouder ◽

Rachel Eloirdi ◽

Mats Jonsson

Keyword(s):

Thin Films ◽

Photoelectron Spectroscopy ◽

Surface Characteristics ◽

Ultraviolet Photoelectron Spectroscopy ◽

Oxidative Dissolution ◽

New Approach ◽

X Ray ◽

Spectroscopy Studies

We report surface characteristics of UO2, U2O5 and UO3 thin films after exposure to gas plasmas: a new approach of the oxidative dissolution problem.

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Optical, Dielectric and X-ray Photoelectron Spectroscopy Studies on Nanocrystalline Ba(Zn1/3Ta2/3)O3 Thin Films Deposited by Pulsed Laser Deposition

Proceedings of the National Academy of Sciences India Section A Physical Sciences ◽

10.1007/s40010-014-0156-2 ◽

2014 ◽

Vol 84 (3) ◽

pp. 457-465

Author(s):

D. Pamu ◽

T. Santhosh Kumar ◽

B. Sreedhar ◽

Anil K. Bhatnagar

Keyword(s):

Thin Films ◽

Pulsed Laser Deposition ◽

Photoelectron Spectroscopy ◽

Pulsed Laser ◽

Laser Deposition ◽

X Ray ◽

Optical Dielectric ◽

Spectroscopy Studies

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The Reflection High Energy Electron Diffraction and X-ray Photoelectron Spectroscopy Studies of CeO2 Thin Films on Bi-based Superconducting Bulk Single Crystals.

Shinku ◽

10.3131/jvsj.37.183 ◽

1994 ◽

Vol 37 (3) ◽

pp. 183-186

Author(s):

Yusuke GOTO ◽

Hiroyuki TSUCHIDA ◽

Heizo TOKUTAKA ◽

Satoru KISHIDA ◽

Kikuo FUJIMURA ◽

...

Keyword(s):

Thin Films ◽

Electron Diffraction ◽

Single Crystals ◽

Photoelectron Spectroscopy ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

X Ray ◽

Bulk Single Crystals ◽

Spectroscopy Studies

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