Silicon nitride single‐layer x‐ray mask

1982 ◽  
Vol 21 (4) ◽  
pp. 1017-1021 ◽  
Author(s):  
Misao Sekimoto ◽  
Hideo Yoshihara ◽  
Takashi Ohkubo
Keyword(s):  
Silicon Nitride ◽  
Single Layer ◽  
X Ray

Silicon Nitride Single-Layer X-Ray Mask

1981 ◽  
Vol 20 (9) ◽  
pp. L669-L672 ◽  
Author(s):  
Misao Sekimoto ◽  
Hideo Yoshihara ◽  
Takashi Ohkubo ◽  
Yasunao Saitoh
Keyword(s):  
Silicon Nitride ◽  
Single Layer ◽  
X Ray

Strain, Stress, and Magnetic Surfaceanisotropy of Epitaxial FE(110)/MO (110) Multilayers

1993 ◽  
Vol 317 ◽  
Author(s):  
R.M. Osgood ◽  
B.M. Clemens ◽  
R.L. White ◽  
S. Brennan
Keyword(s):  
Strain State ◽  
Single Layer ◽  
Grazing Incidence ◽  
Magnetic Surface ◽  
Stress And Strain ◽  
Surface Anisotropy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Plane Direction ◽  
Strain Stress

ABSTRACTGrazing incidence and asymmetric X-ray diffraction were used to measure the stress and strain state of Fe(110)/Mo(110) Multilayers. The highest stress in the Fe constituent of the multilayer was along the [110] in-plane direction and was due to interaction with the substrate. The Magnetic anisotropy of the Fe Multilayer constituent was measured and the magnetic surface anisotropy, which favored in-plane [001] magnetization, was deduced. In contrast, the magnetic surface anisotropy of a single layer of Fe on W preferred in-plane [110] magnetization, in agreement with the Néel Model.

A Method for Quantitative Phase Analysis of Silicon Nitride by X-Ray Diffraction

1990 ◽  
Vol 5 (3) ◽  
pp. 121-124 ◽  
Author(s):  
David J. Devlin ◽  
Kamal E. Amin
Keyword(s):  
Silicon Nitride ◽  
Iterative Method ◽  
Calibration Curve ◽  
Quantitative Measurement ◽  
Quantitative Phase Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Pure Phases ◽  
Yttrium Disilicate

AbstractThe relative intensities ratios for the determination of the relative amounts of alpha and beta phases in silicon nitride and the relative amounts of delta yttrium disilicate (Y2Si2O7) and nitrogen apatite [Y5(SiO4)3N] are reported. These constants were determined using an iterative method applicable when the pure phases are not easily prepared. In addition, a calibration curve was obtained for the quantitative measurement of free silicon in silicon nitride over the range 0 to 0.3% by weight of Si.

Well-Aligned Graphene Oxide Nanosheets Decorated with Zinc Oxide Nanocrystals for High Performance Photocatalytic Application

2015 ◽  
Vol 14 (03) ◽  
pp. 1550007 ◽  
Author(s):  
K. Kaviyarasu ◽  
C. Maria Magdalane ◽  
E. Manikandan ◽  
M. Jayachandran ◽  
R. Ladchumananandasivam ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Graphene Oxide ◽  
High Performance ◽  
Chemical Reduction ◽  
Visible Region ◽  
Single Layer ◽  
Single Layer Graphene ◽  
Graphene Oxides ◽  
X Ray ◽  
Nanoscale Structures

Graphene oxide (GO) nanosheets modified with zinc oxide nanocrystals were achieved by a green wet-chemical approach. As-obtained products were characterized by XRD, Raman spectra, XPS, HR-TEM, EDS, PL and Photocatalytic studies. XRD studies indicate that the GO nanosheet have the same crystal structure found in hexagonal form of ZnO . The enhanced Raman spectrum of 2D bands confirmed formation of single layer graphene oxides. The gradual photocatalytic reduction of the GO nanosheet in the GO : ZnO suspension of ethanol was studied by using X-ray photoelectron (XPS) spectroscopy. The nanoscale structures were observed and confirmed using high resolution transmission electron microscopy (HR-TEM). The evolution of the elemental composition, especially the various numbers of layers were determined from energy dispersive X-ray spectra (EDS). PL properties of GO : ZnO nanosheet were found to be dependent on the growth condition and the resultant morphology revealed that GO nanosheet were highly transparent in the visible region. The photocatalytic performance of GO : ZnO nanocomposites was performed under UV irradiation. Therefore, the ZnO nanocrystals in the GO : ZnO composite could be applied in gradual chemical reduction and consequently tuning the electrical conductivity of the graphene oxide nanosheet.

X-ray reflectometer for single layer and multilayer coating characterization at 8 keV: An interlaboratory study

2016 ◽  
Vol 87 (10) ◽  
pp. 104501 ◽  
Author(s):  
Danielle N. Gurgew ◽  
David M. Broadway ◽  
Mikhail Gubarev ◽  
Brian D. Ramsey ◽  
Don A. Gregory
Keyword(s):  
Multilayer Coating ◽  
Single Layer ◽  
Interlaboratory Study ◽  
X Ray

X-Ray Examination of Fracture Surfaces of Silicon Nitride Ceramics

1990 ◽  
pp. 319-326 ◽  
Author(s):  
Zenjiro Yajima ◽  
Yukio Hirose ◽  
Keisuke Tanaka
Keyword(s):  
Silicon Nitride ◽  
X Ray ◽  
Fracture Surfaces ◽  
Nitride Ceramics
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