Surface analysis of WC–Co composite materials (2) Quantitative Auger electron spectrometry

L. L. Tongson; J. V. Biggers; G. O. Dayton; J. M. Bind; B. E. Knox

doi:10.1116/1.569524

Surface analysis of WC–Co composite materials (2) Quantitative Auger electron spectrometry

Journal of Vacuum Science and Technology ◽

10.1116/1.569524 ◽

1978 ◽

Vol 15 (3) ◽

pp. 1133-1138 ◽

Cited By ~ 8

Author(s):

L. L. Tongson ◽

J. V. Biggers ◽

G. O. Dayton ◽

J. M. Bind ◽

B. E. Knox

Keyword(s):

Composite Materials ◽

Surface Analysis ◽

Auger Electron ◽

Auger Electron Spectrometry ◽

Electron Spectrometry

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4130. Surface analysis of WC-Co composite materials. (2) Quantitative Auger electron spectrometry. (USA)

Vacuum ◽

10.1016/0042-207x(79)90240-9 ◽

1979 ◽

Vol 29 (8-9) ◽

pp. 331

Keyword(s):

Composite Materials ◽

Surface Analysis ◽

Auger Electron ◽

Auger Electron Spectrometry ◽

Electron Spectrometry

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Abstract: Ion scattering and Auger electron spectrometry of WC–Co composite materials

Journal of Vacuum Science and Technology ◽

10.1116/1.569297 ◽

1977 ◽

Vol 14 (1) ◽

pp. 530-530

Author(s):

B. E. Knox ◽

L. L. Tongson ◽

J. V. Biggers

Keyword(s):

Composite Materials ◽

Auger Electron ◽

Ion Scattering ◽

Auger Electron Spectrometry ◽

Electron Spectrometry

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Combined bulk and surface analysis of oxygen species in Si3N4 powders by means of carrier-gas heat-extraction methods and Auger electron spectrometry

Fresenius Journal of Analytical Chemistry ◽

10.1007/bf00321422 ◽

1993 ◽

Vol 346 (1-3) ◽

pp. 237-240 ◽

Cited By ~ 9

Author(s):

J. D. Sunderk�tter ◽

E. Grallath ◽

H. Jenett

Keyword(s):

Surface Analysis ◽

Auger Electron ◽

Extraction Methods ◽

Heat Extraction ◽

Oxygen Species ◽

Carrier Gas ◽

Auger Electron Spectrometry ◽

Electron Spectrometry

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Auger Electron Spectrometry

Systematic Materials Analysis ◽

10.1016/b978-0-12-587801-2.50011-2 ◽

1974 ◽

pp. 57-82

Author(s):

Gary Stupian

Keyword(s):

Auger Electron ◽

Auger Electron Spectrometry ◽

Electron Spectrometry

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Quantitative approach of Auger electron spectrometry

Surface Science ◽

10.1016/0039-6028(77)90133-9 ◽

1977 ◽

Vol 69 (2) ◽

pp. 547-564 ◽

Cited By ~ 28

Author(s):

F Pons ◽

J Le Héricy ◽

J.P Langeron

Keyword(s):

Auger Electron ◽

Quantitative Approach ◽

Auger Electron Spectrometry ◽

Electron Spectrometry

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Application of Auger electron spectrometry to trace analysis: determination of less than 10 ppm sulfur in copper

Analytical Chemistry ◽

10.1021/ac00280a031 ◽

1985 ◽

Vol 57 (3) ◽

pp. 716-719 ◽

Cited By ~ 18

Author(s):

Siegfried. Hofmann ◽

Roland. Frech

Keyword(s):

Trace Analysis ◽

Auger Electron ◽

Auger Electron Spectrometry ◽

Electron Spectrometry ◽

Analysis Determination

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Ion scattering and Auger electron spectrometry of superconducting ’’Nb3Ge’’ sputtered films

Journal of Applied Physics ◽

10.1063/1.322464 ◽

1976 ◽

Vol 47 (11) ◽

pp. 5059-5063 ◽

Cited By ~ 16

Author(s):

Luis L. Tongson ◽

Donald A. Rogowski ◽

Bruce E. Knox

Keyword(s):

Auger Electron ◽

Ion Scattering ◽

Sputtered Films ◽

Auger Electron Spectrometry ◽

Electron Spectrometry

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Determination of the surface predominance of toxic elements in airborne particles by ion microprobe mass spectrometry and Auger electron spectrometry

Analytical Chemistry ◽

10.1021/ac50019a015 ◽

1977 ◽

Vol 49 (11) ◽

pp. 1514-1521 ◽

Cited By ~ 82

Author(s):

R. W. Linton ◽

Peter. Williams ◽

C. A. Evans

Keyword(s):

Mass Spectrometry ◽

Auger Electron ◽

Toxic Elements ◽

Airborne Particles ◽

Ion Microprobe ◽

Auger Electron Spectrometry ◽

Electron Spectrometry

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Talanta review Applications of auger-electron spectrometry

Talanta ◽

10.1016/0039-9140(77)80121-5 ◽

1977 ◽

Vol 24 (7) ◽

pp. 399-415 ◽

Cited By ~ 6

Author(s):

M Thompson

Keyword(s):

Auger Electron ◽

Auger Electron Spectrometry ◽

Electron Spectrometry

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Sensitivity limitations in the analysis of semiconductor devices with auger electron spectrometry (AES) and secondary ion mass spectrometry (SIMS)

Fresenius Zeitschrift für Analytische Chemie ◽

10.1007/bf00516823 ◽

1983 ◽

Vol 314 (3) ◽

pp. 293-299 ◽

Cited By ~ 9

Author(s):

R. v. Criegern ◽

Th. Hillmer ◽

I. Weitzel

Keyword(s):

Mass Spectrometry ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Semiconductor Devices ◽

Auger Electron Spectrometry ◽

Ion Mass Spectrometry ◽

Electron Spectrometry ◽

Secondary Ion

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