Mass spectra database of polymers for bismuth-cluster ToF-SIMS

2019 ◽  
Vol 26 (2) ◽  
pp. 025003 ◽  
Author(s):  
Stefanie Kern ◽  
Christine Kern ◽  
Marcus Rohnke
2015 ◽  
Vol 4 (1) ◽  
pp. 139-148
Author(s):  
H. J. Lehto ◽  
B. Zaprudin ◽  
K. M. Lehto ◽  
T. Lönnberg ◽  
J. Silén ◽  
...  

Abstract. We describe the use of Bayesian analysis methods applied to time-of-flight secondary ion mass spectrometer (TOF-SIMS) spectra. The method is applied to the COmetary Secondary Ion Mass Analyzer (COSIMA) TOF-SIMS mass spectra where the analysis can be broken into subgroups of lines close to integer mass values. The effects of the instrumental dead time are discussed in a new way. The method finds the joint probability density functions of measured line parameters (number of lines, and their widths, peak amplitudes, integrated amplitudes and positions). In the case of two or more lines, these distributions can take complex forms. The derived line parameters can be used to further calibrate the mass scaling of TOF-SIMS and to feed the results into other analysis methods such as multivariate analyses of spectra. We intend to use the method, first as a comprehensive tool to perform quantitative analysis of spectra, and second as a fast tool for studying interesting targets for obtaining additional TOF-SIMS measurements of the sample, a property unique to COSIMA. Finally, we point out that the Bayesian method can be thought of as a means to solve inverse problems but with forward calculations, only with no iterative corrections or other manipulation of the observed data.


2016 ◽  
Vol 48 (11) ◽  
pp. 1114-1118 ◽  
Author(s):  
S. Nishinomiya ◽  
K. Toshin ◽  
R. Shishido ◽  
S. Suzuki

Crystals ◽  
2021 ◽  
Vol 11 (12) ◽  
pp. 1465
Author(s):  
Tinglu Song ◽  
Meishuai Zou ◽  
Defeng Lu ◽  
Hanyuan Chen ◽  
Benpeng Wang ◽  
...  

In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.


2012 ◽  
Vol 311 ◽  
pp. 24-30 ◽  
Author(s):  
Taisuke Nakanaga ◽  
Hidekazu Nagai ◽  
Naoaki Saito ◽  
Yukio Fujiwara ◽  
Hidehiko Nonaka
Keyword(s):  

Author(s):  
J. Silén ◽  
H. Cottin ◽  
M. Hilchenbach ◽  
J. Kissel ◽  
H. Lehto ◽  
...  

Abstract. We describe how to use multivariate analysis of complex TOF-SIMS spectra introducing the method of random projections. The technique allows us to do full clustering and classification of the measured mass spectra. In this paper we use the tool for classification purposes. The presentation describes calibration experiments of 19 minerals on Ag and Au substrates using positive mode ion spectra. The discrimination between individual minerals gives a crossvalidation Cohen κ for classification of typically about 80%. We intend to use the method as a fast tool to deduce a qualitative similarity of measurements.


2008 ◽  
Vol 28 (3) ◽  
pp. 202-209 ◽  
Author(s):  
Ylva Magnusson ◽  
Peter Friberg ◽  
Peter Sjövall ◽  
Frida Dangardt ◽  
Per Malmberg ◽  
...  

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