Mass shift in the mass spectra of TOF-SIMS and the analysis of kinetic energies of the ions

2012 ◽  
Vol 311 ◽  
pp. 24-30 ◽  
Author(s):  
Taisuke Nakanaga ◽  
Hidekazu Nagai ◽  
Naoaki Saito ◽  
Yukio Fujiwara ◽  
Hidehiko Nonaka
Keyword(s):  
Mass Spectra ◽  
Mass Shift ◽  
Tof Sims

scholarly journals Apparent and Actual Shifts in Mass and Width of ϕ Mesons Produced in Heavy-Ion Collisions

1997 ◽  
Vol 12 (02) ◽  
pp. 127-134 ◽  
Author(s):  
R. S. Bhalerao ◽  
S. K. Gupta
Keyword(s):  
Invariant Mass ◽  
Preliminary Data ◽  
Heavy Ion Collisions ◽  
Mass Spectra ◽  
Dense Matter ◽  
Heavy Ion ◽  
High Energy ◽  
Mass Shift ◽  
Ion Collisions ◽  
Invariant Mass Spectra

We present a method of analyzing invariant-mass spectra of kaon pairs resulting from decay of ϕ mesons produced in high-energy heavy-ion collisions. It can be used to extract the shifts in the mass and the width (ΔM and ΔΓ) of the ϕ mesons when they are inside the dense matter formed in these collisions. We illustrate our method with the help of available preliminary data. Extracted values of ΔM and ΔΓ are significantly larger than those obtained with an earlier method. Our results are consistent with the experimentally observed pT dependence of the mass shift. Finally, we present a phenomenological relation between ΔM and ΔΓ. It provides a useful constraint on theories which predict the values of these two quantities.

scholarly journals Analysis of COSIMA spectra: Bayesian approach

2015 ◽  
Vol 4 (1) ◽  
pp. 139-148
Author(s):  
H. J. Lehto ◽  
B. Zaprudin ◽  
K. M. Lehto ◽  
T. Lönnberg ◽  
J. Silén ◽  
...  
Keyword(s):  
Mass Spectra ◽  
Joint Probability ◽  
Mass Analyzer ◽  
Mass Scaling ◽  
Tof Sims ◽  
Analysis Methods ◽  
Measured Line ◽  
Complex Forms ◽  
Joint Probability Density ◽  
Secondary Ion

Abstract. We describe the use of Bayesian analysis methods applied to time-of-flight secondary ion mass spectrometer (TOF-SIMS) spectra. The method is applied to the COmetary Secondary Ion Mass Analyzer (COSIMA) TOF-SIMS mass spectra where the analysis can be broken into subgroups of lines close to integer mass values. The effects of the instrumental dead time are discussed in a new way. The method finds the joint probability density functions of measured line parameters (number of lines, and their widths, peak amplitudes, integrated amplitudes and positions). In the case of two or more lines, these distributions can take complex forms. The derived line parameters can be used to further calibrate the mass scaling of TOF-SIMS and to feed the results into other analysis methods such as multivariate analyses of spectra. We intend to use the method, first as a comprehensive tool to perform quantitative analysis of spectra, and second as a fast tool for studying interesting targets for obtaining additional TOF-SIMS measurements of the sample, a property unique to COSIMA. Finally, we point out that the Bayesian method can be thought of as a means to solve inverse problems but with forward calculations, only with no iterative corrections or other manipulation of the observed data.

Mass spectra database of polymers for bismuth-cluster ToF-SIMS

2019 ◽  
Vol 26 (2) ◽  
pp. 025003 ◽  
Author(s):  
Stefanie Kern ◽  
Christine Kern ◽  
Marcus Rohnke
Keyword(s):  
Mass Spectra ◽  
Tof Sims ◽  
Bismuth Cluster

scholarly journals Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer

Crystals ◽  
2021 ◽  
Vol 11 (12) ◽  
pp. 1465
Author(s):  
Tinglu Song ◽  
Meishuai Zou ◽  
Defeng Lu ◽  
Hanyuan Chen ◽  
Benpeng Wang ◽  
...  
Keyword(s):  
Mass Spectrometer ◽  
Crystal Orientation ◽  
Mass Spectra ◽  
Time Of Flight ◽  
Surface Characteristic ◽  
Alloy Surface ◽  
Surface Information ◽  
Tof Sims ◽  
Ion Yields ◽  
Secondary Ion

In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.

scholarly journals COSIMA data analysis using multivariate techniques

2014 ◽  
Vol 4 (2) ◽  
pp. 455-489 ◽  
Author(s):  
J. Silén ◽  
H. Cottin ◽  
M. Hilchenbach ◽  
J. Kissel ◽  
H. Lehto ◽  
...  
Keyword(s):  
Multivariate Analysis ◽  
Mass Spectra ◽  
Random Projections ◽  
Multivariate Techniques ◽  
Tof Sims ◽  
Positive Mode ◽  
Clustering And Classification ◽  
Qualitative Similarity ◽  
Measured Mass

Abstract. We describe how to use multivariate analysis of complex TOF-SIMS spectra introducing the method of random projections. The technique allows us to do full clustering and classification of the measured mass spectra. In this paper we use the tool for classification purposes. The presentation describes calibration experiments of 19 minerals on Ag and Au substrates using positive mode ion spectra. The discrimination between individual minerals gives a crossvalidation Cohen κ for classification of typically about 80%. We intend to use the method as a fast tool to deduce a qualitative similarity of measurements.

Applications of Time-OF-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

1990 ◽  
Vol 48 (2) ◽  
pp. 308-309
Author(s):  
Bruno Schueler ◽  
Robert W. Odom
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Structural Information ◽  
Time Of Flight ◽  
Biological Tissues ◽  
Polymer Surfaces ◽  
Tof Sims ◽  
Secondary Ions ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) provides unique capabilities for elemental and molecular compositional analysis of a wide variety of surfaces. This relatively new technique is finding increasing applications in analyses concerned with determining the chemical composition of various polymer surfaces, identifying the composition of organic and inorganic residues on surfaces and the localization of molecular or structurally significant secondary ions signals from biological tissues. TOF-SIMS analyses are typically performed under low primary ion dose (static SIMS) conditions and hence the secondary ions formed often contain significant structural information.This paper will present an overview of current TOF-SIMS instrumentation with particular emphasis on the stigmatic imaging ion microscope developed in the authors’ laboratory. This discussion will be followed by a presentation of several useful applications of the technique for the characterization of polymer surfaces and biological tissues specimens. Particular attention in these applications will focus on how the analytical problem impacts the performance requirements of the mass spectrometer and vice-versa.

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