scholarly journals Silicon nanocone formation via low-energy helium ion sputtering

2018 ◽  
Vol 36 (5) ◽  
pp. 051202 ◽  
Author(s):  
Theodore J. Novakowski ◽  
Jitendra K. Tripathi ◽  
Ahmed Hassanein
Keyword(s):  
Low Energy ◽  
Ion Sputtering ◽  
Helium Ion

scholarly journals Characterization of nitrogen species incorporated into graphite using low energy nitrogen ion sputtering

2016 ◽  
Vol 18 (1) ◽  
pp. 458-465 ◽  
Author(s):  
Hisao Kiuchi ◽  
Takahiro Kondo ◽  
Masataka Sakurai ◽  
Donghui Guo ◽  
Junji Nakamura ◽  
...  
Keyword(s):  
Low Energy ◽  
Nitrogen Species ◽  
Ion Sputtering ◽  
Zigzag Edge ◽  
Nitrogen Doped ◽  
Doping Mechanism ◽  
Nitrogen Ions ◽  
Nitrogen Ion

The well-controlled nitrogen doped graphite with graphitic nitrogen located in the zigzag edge and/or vacancy sites can be realized using the low energy nitrogen sputtering. The doping mechanism of nitrogen ions is also discussed.

Effect of Thin Carbonaceous Films on 500‐keV Helium Ion Sputtering of Copper

1965 ◽  
Vol 36 (6) ◽  
pp. 1952-1957 ◽  
Author(s):  
Harold P. Smith ◽  
D. W. DeMichele ◽  
J. M. Khan
Keyword(s):  
Ion Sputtering ◽  
Helium Ion

AFM ANALYSIS OF QUANTUM DOT STRUCTURES INDUCED BY ION SPUTTERING WITH DIFFERENT TIPS

2003 ◽  
Vol 10 (06) ◽  
pp. 837-841
Author(s):  
M. XU ◽  
C. TEICHERT
Keyword(s):  
Quantum Dot ◽  
High Hardness ◽  
Complete Information ◽  
Low Energy ◽  
Order Structure ◽  
Ion Sputtering ◽  
Soft Or ◽  
Surface Information ◽  
Complete Surface ◽  
Afm Analysis

With tips of different hardness, we analyzed the effect of the hardness and shape of the actual AFM tip on the measurement of the best GaSb quantum dot (QD) structures induced by low energy Ar + sputtering. The comparison indicated that the complete information on the detailed dot shape and order structure can be determined with the hard and good tip, while with the soft or worn tip some information on the dot height and shape cannot be obtained. Our results suggest that, in order to obtain the complete surface information, the high hardness and good AFM tip should be used for semiconductor QD structures.

scholarly journals Fabrication of carbon nanotube nanogap electrodes by helium ion sputtering for molecular contacts

2014 ◽  
Vol 104 (10) ◽  
pp. 103102 ◽  
Author(s):  
Cornelius Thiele ◽  
Henning Vieker ◽  
André Beyer ◽  
Benjamin S. Flavel ◽  
Frank Hennrich ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Ion Sputtering ◽  
Helium Ion ◽  
Nanogap Electrodes

Structural response of transient heat loading on a molybdenum surface exposed to low-energy helium ion irradiation

2016 ◽  
Vol 56 (3) ◽  
pp. 036005 ◽  
Author(s):  
G. Sinclair ◽  
J.K. Tripathi ◽  
P.K. Diwakar ◽  
A. Hassanein
Keyword(s):  
Ion Irradiation ◽  
Structural Response ◽  
Low Energy ◽  
Helium Ion ◽  
Heat Loading

Nonlinear effects in low-energy ion sputtering of solids

2020 ◽  
Vol 38 (5) ◽  
pp. 053203 ◽  
Author(s):  
Yuriy Kudriavtsev ◽  
Rene Asomoza ◽  
Angelica Hernandez ◽  
Dmitry Yu. Kazantsev ◽  
Boris Ya. Ber ◽  
...  
Keyword(s):  
Nonlinear Effects ◽  
Low Energy ◽  
Ion Sputtering
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