Patterning of defect arrays with e-beam lithography used to develop a high throughput e-beam defect inspection tool

Author(s):  
Kevin D. Cummings ◽  
Ben Bunday ◽  
Matt Malloy ◽  
John Hartley ◽  
Laila Banu ◽  
...  
Author(s):  
Patrick Helfenstein ◽  
Iacopo Mochi ◽  
Rajendran Rajeev ◽  
Sara Fernandez ◽  
Dimitrios Kazazis ◽  
...  

2007 ◽  
Vol 177 (4S) ◽  
pp. 52-53
Author(s):  
Stefano Ongarello ◽  
Eberhard Steiner ◽  
Regina Achleitner ◽  
Isabel Feuerstein ◽  
Birgit Stenzel ◽  
...  

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