Probing compositional disorder in vanadium oxide thin films grown on atomic layer deposited hafnia on silicon by capacitance spectroscopy
2012 ◽
Vol 30
(1)
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pp. 011501
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2016 ◽
Vol 32
(1)
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pp. 37-44
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1999 ◽
Vol 3
(10)
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pp. 485
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2008 ◽
Vol 21
(2)
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pp. 156-161
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2006 ◽
Vol 252
(16)
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pp. 5917-5925
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2016 ◽
Vol 46
(4)
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pp. 2153-2157
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Keyword(s):
2017 ◽
Vol 9
(28)
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pp. 23909-23917
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Keyword(s):
Keyword(s):