Observation of fringelike electron-emission pattern in field emission from Pt field emitter fabricated by electron-beam-induced deposition

2007 ◽  
Vol 25 (4) ◽  
pp. 1310 ◽  
Author(s):  
K. Murakami ◽  
F. Wakaya ◽  
M. Takai
Keyword(s):  
Electron Beam ◽  
Field Emission ◽  
Electron Emission ◽  
Emission Pattern ◽  
Field Emitter ◽  
Electron Beam Induced Deposition

Integrated tungsten nanofiber field emission cathodes selectively grown by nanoscale electron beam-induced deposition

2005 ◽  
Vol 86 (18) ◽  
pp. 183106 ◽  
Author(s):  
X. Yang ◽  
M. L. Simpson ◽  
S. J. Randolph ◽  
P. D. Rack ◽  
L. R. Baylor ◽  
...  
Keyword(s):  
Electron Beam ◽  
Field Emission ◽  
Electron Beam Induced Deposition ◽  
Field Emission Cathodes

Field Emission Properties of Individual Carbon Nanotubes in Nanorobotic Manipulation and Electron-Beam-Induced Deposition

2004 ◽  
Vol 16 (6) ◽  
pp. 597-603 ◽  
Author(s):  
Fumihito Arai ◽  
◽  
Pou Liu ◽  
Lixin Dong ◽  
Toshio Fukuda ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Field Emission ◽  
Emission Current ◽  
Emission Properties ◽  
Field Emission Properties ◽  
Field Emission Current ◽  
Multi Walled Carbon Nanotubes ◽  
Electron Beam Induced Deposition ◽  
Afm Cantilever

Field emission properties of individual multi-walled carbon nanotubes (MWNTs) were studied in nanorobotic manipulation and electron-beam-induced deposition (EBID). Nanotube emitters are constructed by picking up and assembling individual nanotubes on a commercially available atomic force microscope (AFM) cantilever or a tungsten probe. The relationship between field emission current and interelectrode distance was obtained by changing the distance between the tip of the nanotube emitter and the counterpart anode, which can be potentially applied as the principle for an approaching sensor to detect nanometer scale distance by observing field emission current in real time. Field emission current on a microampere scale from a CNT emitter was shown to be strong enough for EBID without obviously degrading emitters. Deposit topology was related to current density or the emitter shape, suggesting that information on emitter geometry could be obtained from EBID deposits. Energy dispersive X-ray spectrometry (EDS) analysis of deposits from W(CO)6showed that the tungsten mass exceeds 80% on the average among compositions. Much higher voltage may degrade the emitter, and saturated current may be used to adjust the emitter length in a controlled way.

Electron Emission Properties of Si Field Emitter Arrays Coated With Nanocrystalline Diamond From Fullerene Precursors

1997 ◽  
Vol 498 ◽  
Author(s):  
T. G. McCauley ◽  
T. D. Corrigan ◽  
A. R. Krauss ◽  
O. Auciello ◽  
D. Zhou ◽  
...  
Keyword(s):  
Field Emission ◽  
Electron Emission ◽  
Microwave Plasma ◽  
Chemical Vapor ◽  
Nanocrystalline Diamond ◽  
Threshold Field ◽  
Field Emitter ◽  
Effective Work ◽  
Field Emitter Arrays ◽  
Electron Field

ABSTRACTIn this paper, we report on a substantial lowering of the threshold field for electron field emission from Si field emitter arrays (FEA), which have been coated with a thin layer of nanocrystalline diamond by microwave plasma-assisted chemical vapor deposition (MPCVD) from fullerene (C60) and methane (CH4) precursors. The field emission characteristics were investigated and the emission sites imaged using photoelectron emission microscopy (PEEM). Electron emission from these Si FEAs coated with nanocrystalline diamond was observed at threshold fields as low as 3 V/μm, with effective work functions as low as 0.59 eV.

Sign in / Sign up

Export Citation Format

Share Document