Optical monitoring of molecular beam epitaxy growth of AlN∕GaN using single-wavelength laser interferometry: A simple method of tracking real-time changes in growth rate

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Tong-Ho Kim ◽  
Soojeong Choi ◽  
Pae Wu ◽  
Maria M. Giangregorio ◽  
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1988 ◽  
Vol 64 (7) ◽  
pp. 3522-3527 ◽  
Author(s):  
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Seiichi Miyazawa

2014 ◽  
Vol 390 ◽  
pp. 120-124 ◽  
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Robert D. Richards ◽  
Faebian Bastiman ◽  
Christopher J. Hunter ◽  
Danuta F. Mendes ◽  
Abdul R. Mohmad ◽  
...  

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