Efficient fabrication and characterization of cobalt nanoparticles embedded in metal∕oxide∕semiconductor structures for the application of nonvolatile memory

Jung Yup Yang; Kap Soo Yoon; Won Joon Choi; Young Ho Do; Ju Hyung Kim; Chae Ok Kim; Jin Pyo Hong

doi:10.1116/1.2366612

Efficient fabrication and characterization of cobalt nanoparticles embedded in metal∕oxide∕semiconductor structures for the application of nonvolatile memory

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2366612 ◽

2006 ◽

Vol 24 (6) ◽

pp. 2636 ◽

Cited By ~ 1

Author(s):

Jung Yup Yang ◽

Kap Soo Yoon ◽

Won Joon Choi ◽

Young Ho Do ◽

Ju Hyung Kim ◽

...

Keyword(s):

Metal Oxide ◽

Nonvolatile Memory ◽

Cobalt Nanoparticles ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Semiconductor Structures ◽

Fabrication And Characterization

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Interface/border trap characterization of Al2O3/AlN/GaN metal-oxide-semiconductor structures with an AlN interfacial layer

Applied Physics Letters ◽

10.1063/1.4907861 ◽

2015 ◽

Vol 106 (5) ◽

pp. 051605 ◽

Cited By ~ 52

Author(s):

Shenghou Liu ◽

Shu Yang ◽

Zhikai Tang ◽

Qimeng Jiang ◽

Cheng Liu ◽

...

Keyword(s):

Metal Oxide ◽

Interfacial Layer ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Semiconductor Structures

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Fabrication and Characterization of 1700 V 4H-SiC Vertical Double-Implanted Metal-Oxide-Semiconductor Field-Effect Transistors

Chinese Physics Letters ◽

10.1088/0256-307x/32/12/127101 ◽

2015 ◽

Vol 32 (12) ◽

pp. 127101 ◽

Cited By ~ 1

Author(s):

Hua-Jun Shen ◽

Ya-Chao Tang ◽

Zhao-Yang Peng ◽

Xiao-Chuan Deng ◽

Yun Bai ◽

...

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Fabrication And Characterization

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Formation and characterization of nanometer scale metal-oxide-semiconductor structures on GaAs using low-temperature atomic layer deposition

Applied Physics Letters ◽

10.1063/1.1954902 ◽

2005 ◽

Vol 87 (1) ◽

pp. 013501 ◽

Cited By ~ 17

Author(s):

P. D. Ye ◽

G. D. Wilk ◽

E. E. Tois ◽

Jian Jim Wang

Keyword(s):

Low Temperature ◽

Atomic Layer Deposition ◽

Metal Oxide ◽

Atomic Layer ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Nanometer Scale ◽

Semiconductor Structures ◽

Layer Deposition

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Fabrication and characterization of vertical-type double-gate metal-oxide-semiconductor field-effect transistor with ultrathin Si channel and self-aligned source and drain

Applied Physics Letters ◽

10.1063/1.2173715 ◽

2006 ◽

Vol 88 (7) ◽

pp. 072103 ◽

Cited By ~ 7

Author(s):

Meishoku Masahara ◽

Yongxun Liu ◽

Kazuhiko Endo ◽

Takashi Matsukawa ◽

Kunihiro Sakamoto ◽

...

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistor ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Double Gate ◽

Effect Transistor ◽

Fabrication And Characterization

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Fabrication and characterization of a silicon metal-oxide-semiconductor based triple quantum dot

Applied Physics Letters ◽

10.1063/1.4731275 ◽

2012 ◽

Vol 100 (26) ◽

pp. 263109 ◽

Cited By ~ 6

Author(s):

H. Pan ◽

M. G. House ◽

X. Hao ◽

H. W. Jiang

Keyword(s):

Quantum Dot ◽

Metal Oxide ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Fabrication And Characterization

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Low temperature fabrication and characterization of nickel germanide Schottky source/drain contacts for implant-less germanium p-channel metal-oxide-semiconductor field-effect transistors

Applied Physics Letters ◽

10.1063/1.4712564 ◽

2012 ◽

Vol 100 (19) ◽

pp. 192101 ◽

Cited By ~ 9

Author(s):

D. R. Gajula ◽

D. W. McNeill ◽

B. E. Coss ◽

H. Dong ◽

S. Jandhyala ◽

...

Keyword(s):

Low Temperature ◽

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Fabrication And Characterization

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Fabrication and Characterization of a Metal Oxide Semiconductor Field Effect Transistor (MOSFET)-based Micro pH Sensor

2020 Medical Technologies Congress (TIPTEKNO) ◽

10.1109/tiptekno50054.2020.9299291 ◽

2020 ◽

Author(s):

Fikri Seven ◽

ve Mustafa Sen

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistor ◽

Ph Sensor ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Effect Transistor ◽

Fabrication And Characterization

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Fabrication and Characterization of CdF2/CaF2 Resonant Tunneling Floating Gate Metal-oxide-semiconductor Field Effect Transistor Structures

10.7567/ssdm.2008.h-9-3 ◽

2008 ◽

Author(s):

M. Watanabe ◽

T. Wada

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Resonant Tunneling ◽

Field Effect Transistor ◽

Metal Oxide Semiconductor ◽

Floating Gate ◽

Oxide Semiconductor ◽

Effect Transistor ◽

Fabrication And Characterization

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Fabrication and characterization of metal-oxide-semiconductor GaAs capacitors on Ge∕Si[sub 1−x]Ge[sub x]∕Si substrates with Al[sub 2]O[sub 3] gate dielectric

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2835061 ◽

2008 ◽

Vol 26 (3) ◽

pp. 1182 ◽

Cited By ~ 2

Author(s):

D. Shahrjerdi ◽

N. Nuntawong ◽

G. Balakrishnan ◽

D. I. Garcia-Gutierrez ◽

A. Khoshakhlagh ◽

...

Keyword(s):

Metal Oxide ◽

Gate Dielectric ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Si Substrates ◽

Fabrication And Characterization

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Fabrication and characterization of the normally-off N-channel lateral 4H–SiC metal–oxide–semiconductor field-effect transistors

Chinese Physics B ◽

10.1088/1674-1056/25/3/037306 ◽

2016 ◽

Vol 25 (3) ◽

pp. 037306

Author(s):

Qing-Wen Song ◽

Xiao-Yan Tang ◽

Yan-Jing He ◽

Guan-Nan Tang ◽

Yue-Hu Wang ◽

...

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Fabrication And Characterization

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