Effects of N2 remote plasma nitridation on the structural and electrical characteristics of the HfO2 gate dielectrics grown using remote plasma atomic layer deposition methods
2006 ◽
Vol 24
(4)
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pp. 900-907
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2007 ◽
Vol 154
(2)
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pp. H97
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2013 ◽
Vol 109
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pp. 64-67
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2003 ◽
Vol 42
(Part 2, No. 4B)
◽
pp. L414-L416
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2005 ◽
Vol 74
(1)
◽
pp. 181-187
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2018 ◽
Vol 13
(3)
◽
pp. 1800454
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