High aspect ratio pattern transfer in imprint lithography using a hybrid mold

Author(s):  
Wen-Chang Liao ◽  
Steve Lien-Chung Hsu
2012 ◽  
Vol 1512 ◽  
Author(s):  
Jian-Wei Ho ◽  
Qixun Wee ◽  
Jarrett Dumond ◽  
Li Zhang ◽  
Keyan Zang ◽  
...  

ABSTRACTA combinatory approach of Step-and-Flash Imprint Lithography (SFIL) and Metal-Assisted Chemical Etching (MacEtch) was used to generate near perfectly-ordered, high aspect ratio silicon nanowires (SiNWs) on 4" silicon wafers. The ordering and shapes of SiNWs depends only on the SFIL nanoimprinting mould used, thereby enabling arbitary SiNW patterns not possible with nanosphere and interference lithography (IL) to be generated. Very densely packed SiNWs with periodicity finer than that permitted by conventional photolithography can be produced. The height of SiNWs is, in turn, controlled by the etching duration. However, it was found that very high aspect ratio SiNWs tend to be bent during processing. Hexagonal arrays of SiNW with circular and hexagonal cross-sections of dimensions 200nm and less were produced using pillar and pore patterned SFIL moulds. In summary, this approach allows highlyordered SiNWs to be fabricated on a wafer-level basis suitable for semiconductor device manufacturing.


2019 ◽  
Vol 210 ◽  
pp. 8-13 ◽  
Author(s):  
Li-Ting Tseng ◽  
Dimitrios Kazazis ◽  
Xiaolong Wang ◽  
Carmen M. Popescu ◽  
Alex P.G. Robinson ◽  
...  

2004 ◽  
Author(s):  
Yoshihiko Hirai ◽  
Takaaki Konishi ◽  
Tomohiro Kanakugi ◽  
Hiroaki Kawata ◽  
Hisao Kikuta

1999 ◽  
Author(s):  
Yadong Liu ◽  
Paul Sheng

Abstract The fabrication of repetitive mechanical structures in millimeter range by deep x-ray micromachining is reported in this paper. With higher energy and wider x-ray beam lines available, macro-sized mechanical structures with micro-level features can be fabricated by the modified LIGA process to meet the need on high aspect ratio, high precision components in advanced applications. Through metrology study, better understanding of the process characteristics is achieved to provide important information on error modes in pattern transfer, which could be ultimately used in product design and process planning. Case studies of a rectangular HESSI grid structure and involute gear teeth are presented.


2011 ◽  
Vol 88 (8) ◽  
pp. 2145-2148 ◽  
Author(s):  
Yusuke Tanabe ◽  
Hiroyuki Nishikawa ◽  
Yoshihiro Seki ◽  
Takahiro Satoh ◽  
Yasuyuki Ishii ◽  
...  

2019 ◽  
Vol 7 (29) ◽  
pp. 8803-8812 ◽  
Author(s):  
Nikhil Tiwale ◽  
Ashwanth Subramanian ◽  
Kim Kisslinger ◽  
Ming Lu ◽  
Jiyoung Kim ◽  
...  

Novel positive-tone hybrid resists developed by vapor-phase inorganic infiltration feature fully tunable resist performance parameters and high-aspect-ratio pattern transfer capability.


2019 ◽  
Vol 58 (SE) ◽  
pp. SE0802 ◽  
Author(s):  
Taku Iwase ◽  
Yoshito Kamaji ◽  
Song Yun Kang ◽  
Kazunori Koga ◽  
Nobuyuki Kuboi ◽  
...  

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