scholarly journals Interpretation of stress variation in silicon nitride films deposited by electron cyclotron resonance plasma

2004 ◽  
Vol 22 (5) ◽  
pp. 1962-1970 ◽  
Author(s):  
M. P. Besland ◽  
M. Lapeyrade ◽  
F. Delmotte ◽  
G. Hollinger
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