Interpretation of stress variation in silicon nitride films deposited by electron cyclotron resonance plasma
2004 ◽
Vol 22
(5)
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pp. 1962-1970
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2001 ◽
Vol 19
(4)
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pp. 1336-1340
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2003 ◽
Vol 18
(7)
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pp. 633-641
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1999 ◽
Vol 17
(5)
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pp. 2612-2618
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1998 ◽
1994 ◽
Vol 28
(1-3)
◽
pp. 369-373
1999 ◽
Vol 38
(Part 1, No. 8)
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pp. 4868-4871
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