Single-phase growth studies of GaP on Si by solid-source molecular beam epitaxy

Author(s):  
Xiaojun Yu ◽  
Paulina S. Kuo ◽  
Kai Ma ◽  
Ofer Levi ◽  
Martin M. Fejer ◽  
...  
1993 ◽  
Vol 127 (1-4) ◽  
pp. 755-758 ◽  
Author(s):  
J.-P. Reithmaier ◽  
S. Hausser ◽  
H.P. Meier ◽  
W. Walter

1996 ◽  
Vol 164 (1-4) ◽  
pp. 256-262 ◽  
Author(s):  
W.G. Bi ◽  
X.B. Mei ◽  
C.W. Tu

2000 ◽  
Vol 74 (1-3) ◽  
pp. 25-31 ◽  
Author(s):  
M. Lipinski ◽  
H. Schuler ◽  
P. Veit ◽  
R. Clos ◽  
K. Eberl

2011 ◽  
Vol 323 (1) ◽  
pp. 363-367 ◽  
Author(s):  
M. Hassan ◽  
G. Springholz ◽  
R.T. Lechner ◽  
H. Groiss ◽  
R. Kirchschlager ◽  
...  

1985 ◽  
Vol 54 ◽  
Author(s):  
R. W. Fathauer ◽  
L. J. Schowalter ◽  
N. Lewis ◽  
E. L. Hall

ABSTRACTSi and Ge layers have been grown on CaF /Si (111) by molecular beam epitaxy (MBE). The use of thin room-tempe rature predeposits [1] with Ge epitaxy has been found to improve the growth. Studies of the initial stages of Ge epitaxy indicate that island growth occurs, and evidence also indicates island formation occurs in the Si case as well. A qualitative model is presented which explains many of the features observed in these systems and suggests reasons for the superior growth of Ge compared to Si. Finally, use of a Ge Si, /Si superlattice is shown to improve Si epitaxy.


2020 ◽  
Vol 523 ◽  
pp. 146428
Author(s):  
Trung T. Pham ◽  
Roshan Castelino ◽  
Alexandre Felten ◽  
Robert Sporken

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