Formation of polycrystalline silicon germanium/HfO2 gate stack structure using inductively coupled plasma etching
2003 ◽
Vol 21
(4)
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pp. 1210-1217
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2005 ◽
Vol 34
(6)
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pp. 740-745
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2015 ◽
Vol 32
(5)
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pp. 058102
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1999 ◽
Vol 17
(3)
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pp. 768-773
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2011 ◽
Vol 50
(6)
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pp. 06GG07
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