X-ray photoelectron spectroscopic characterization of the adhesion behavior of chemical vapor deposited copper films
2001 ◽
Vol 19
(5)
◽
pp. 2642-2651
◽
Keyword(s):
X Ray
◽
2006 ◽
Vol 12
(11)
◽
pp. 679-684
◽
Keyword(s):
2015 ◽
Vol 2
(2)
◽
pp. 106-121
◽
Keyword(s):
1992 ◽
Vol 63
(1)
◽
pp. 1181-1184
◽
Keyword(s):
1999 ◽
Vol 425
(2-3)
◽
pp. 245-258
◽