Temperature dependence of atomic scale morphology in Si homoepitaxy between 350 and 800 °C on Si (100) by molecular beam epitaxy
2001 ◽
Vol 19
(5)
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pp. 2307-2311
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2010 ◽
Vol 312
(9)
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pp. 1491-1495
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1995 ◽
Vol 34
(Part 1, No. 9A)
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pp. 4593-4598
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2001 ◽
Vol 227-228
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pp. 266-270
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2011 ◽
Vol 318
(1)
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pp. 450-453
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