Design and Fabrication of Electrostatic Microcolumn With Varying Apertures in Massively Parallel Electron Beam Lithography

2017 ◽  
Author(s):  
Zhidong Du ◽  
Ye Wen ◽  
Liang Pan

Massively parallel electron beam lithography may be an alternative manufacturing method in semiconductor industry if the issues of the multi electron beam source are addressed. The microcolumns are suitable for the massively parallel electron beam lithography because of their compactness and the ability to achieve high spatial resolution. A new design with varying apertures for our recent nanoscale photoemission source is presented here. Given the easiness of the fabrication of the microcolumn, we optimized the parameters of the design and found that the resolution can be improved by changing the ratio between the diameters of the focus and extractor electrodes.

2000 ◽  
Vol 132 (2-4) ◽  
pp. 113-128 ◽  
Author(s):  
Ian Barkshire ◽  
Peter Karduck ◽  
Werner P. Rehbach ◽  
Silvia Richter

2012 ◽  
Vol 18 (6) ◽  
pp. 1246-1252
Author(s):  
Natasha Erdman ◽  
Charles Nielsen ◽  
Vernon E. Robertson

AbstractPreviously, imaging and analysis with cathodoluminescence (CL) detectors required using high accelerating voltages. Utilization of lower accelerating voltage for microanalysis has the advantages of reduced beam-specimen interaction volume, and thus better spatial resolution, as well as reduction in electron beam induced damage. This article will highlight recent developments in field emission gun–scanning electron microscope technology that have allowed acquisition of high spatial resolution CL images at very low accelerating voltages. The advantages of low kV CL imaging will be shown using examples of a geological specimen (shale) and a specimen of an industrial grade diamond.


2013 ◽  
Vol 12 (3) ◽  
pp. 031107 ◽  
Author(s):  
Luca Grella ◽  
Allen Carroll ◽  
Kirk Murray ◽  
Mark A. McCord ◽  
William M. Tong ◽  
...  

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