Thermo-Mechanical Deformation and Stress Analysis of a Flip-Chip BGA

2003 ◽  
Author(s):  
J. D. Wu ◽  
Y. S. Lai ◽  
Y. L. Kuo ◽  
S. C. Hung ◽  
M.-H. R. Jen
Keyword(s):  
Flip Chip ◽  
Thermal Loading ◽  
Mechanical Deformation ◽  
Substrate Thickness ◽  
Inelastic Material ◽  
Out Of Plane ◽  
Cte Mismatch ◽  
Constitutive Response ◽  
Chip Carrier ◽  
Plane Displacement

This paper investigates thermo-mechanical deformation and stresses of a flip-chip package (FCBGA) with and without underfill materials. Chip carrier is a 2-2-2 build-up substrate with 40 × 40 mm2 dimension; while bump material employs Sn/37Pb eutectic solder. Temperature-dependent warpage (out-of-plane displacement) of a FCBGA is characterized via shadow moire´ technique. Results of warpage measurement reveal that packages do not follow the same path during thermal loading/unloading cycle (20-220-20 °C) for both FCBGA with and without underfills. This implies that both solder and underfill exhibit inelastic material response. Therefore, it is a necessity to consider nonlinear constitutive response of packaging materials when designing flip-chip packages. It is observed that FCBGA with underfill exhibit more warpage than packages without underfill due to higher CTE mismatch between underfills and silicon dies. Aspect of package geometry such as die-to-substrate thickness ratio is found to play important role in reducing package stresses. Especially, thinner die provides more direct impact to die stresses reduction than thinner substrate does.

Warpage of Flip Chip BGA Package

2006 ◽  
Author(s):  
Milena Vujosevic
Keyword(s):  
Flip Chip ◽  
Plate Theory ◽  
Contour Plot ◽  
Thermally Induced ◽  
Ball Grid Arrays ◽  
Fundamental Understanding ◽  
Out Of Plane ◽  
Bga Package ◽  
Plane Displacement ◽  
Analytical Expressions

The work focuses on the thermally induced out of plane displacement of Flip Chip Ball Grid Arrays (FCBGA). Analytical expressions for substrate displacements are derived based on the Plate Theory and Suhir's solution for stresses in tri-material assembly. The validity of the model is established by comparing the analytical solution to the finite element results as well as to the experimental data. The benefits of the model are twofold: 1) it provides a tool for fundamental understanding of the parameters that influence warpage, and 2) has a predictive capability. With respect to 1) an analysis is presented on the nature and degree of influence that different geometric and material parameters have on the FCBGA warpage. With respect to 2) the "Warpage Contour Plot" is proposed as a tool for warpage prediction that can be easily utilized in the early stages of the design process.

Warpage Measurement Using Projection Moire´ System and Two Automatic Image Segmentation Algorithms

2007 ◽  
Author(s):  
Wei Tan ◽  
I. Charles Ume
Keyword(s):  
Image Segmentation ◽  
Electronic Packages ◽  
Printed Wiring Board ◽  
Segmentation Algorithms ◽  
Out Of Plane ◽  
Cte Mismatch ◽  
Image Models ◽  
Wiring Board ◽  
Plane Displacement ◽  
Projection Moire

Out-of-plane displacement (warpage) has been a major reliability concern for board-level electronic packaging. Printed wiring board (PWB) and component warpage results from CTE mismatch among the materials that make up the PWB assembly (PWBA). Warpage occurring during surface-mount assembly reflow processes and normal operations may lead to serious reliability problems. In this paper, a projection moire´ warpage measurement system and two types of automatic image segmentation algorithms were presented. In order to use the projection moire´ technique to separately determine the warpage of a PWB and assembled electronic packages in a PWBA, two image segmentation algorithms based on mask image models and active contour models (snakes) were developed. They were used to detect package locations in a PWBA displacement image generated by the projection moire´ system. The performances of the mask image and snake approaches based on their resolutions, processing rates, and measurement efficiencies were evaluated in this research. Real-time composite Hermite surface models were constructed to estimate the PWB warpage values underneath the electronic packages. The above automatic image segmentation algorithms were integrated with the projection moire´ system to accurately evaluate the warpage of PWBs and assembled chip packages individually.

Reliability Analysis of Flip Chip Designs Via Computer Simulation

2000 ◽  
Vol 122 (3) ◽  
pp. 214-219 ◽  
Author(s):  
Hua Lu ◽  
C. Bailey ◽  
M. Cross
Keyword(s):  
Material Properties ◽  
Flip Chip ◽  
Thermal Loading ◽  
Coefficient Of Thermal Expansion ◽  
Empirical Relationship ◽  
Life Time ◽  
Fatigue Reliability ◽  
Chip Design ◽  
Flip Chips ◽  
Out Of Plane

A flip chip component is a silicon chip mounted to a substrate with the active area facing the substrate. This paper presents the results of an investigation into the relationship between a number of important material properties and geometric parameters on the thermal-mechanical fatigue reliability of a standard flip chip design and a flip chip design with the use of microvias. Computer modeling has been used to analyze the mechanical conditions of flip chips under cyclic thermal loading where the Coffin-Manson empirical relationship has been used to predict the life time of the solder interconnects. The material properties and geometry parameters that have been investigated are the Young’s modulus, the coefficient of thermal expansion (CTE) of the underfill, the out-of-plane CTE CTEz of the substrate, the thickness of the substrate, and the standoff height. When these parameters vary, the predicted life-times are calculated and some of the features of the results are explained. By comparing the predicted lifetimes of the two designs and the strain conditions under thermal loading, the local CTE mismatch has been found to be one of most important factors in defining the reliability of flip chips with microvias. [S1043-7398(00)01203-2]

Quality Inspection of Flip Chip Solder Bumps Using Integrated Analytical, Numerical, and Experimental Modal Analyses

2008 ◽  
Vol 130 (3) ◽  
Author(s):  
Jin Yang ◽  
I. Charles Ume
Keyword(s):  
Modal Analysis ◽  
Manufacturing Industry ◽  
Flip Chip ◽  
Solder Bump ◽  
Dynamic Responses ◽  
Mode Shapes ◽  
Inspection System ◽  
Solder Bumps ◽  
Out Of Plane ◽  
Plane Displacement

Solder bump inspection of surface mount packages has been a crucial process in the electronics manufacturing industry. A solder bump inspection system has been developed using laser ultrasound and interferometric techniques. In this research, modal analysis is important to correlate the defects with dynamic responses of packaged electronic devices under pulsed laser loading. The effect of solder bump defects on the mode frequencies and mode shapes is reported in this paper. The objective is to develop a modal analysis approach, which integrates analytical, numerical, and experimental methods. In particular, this paper discusses the analytical modeling, numerical modeling, and transient out-of-plane displacement measurements for a 6.35×6.35×0.6mm3 PB18 flip chip mounted on a FR4 board.

scholarly journals Sensor Integrated Load-Bearing Structures: Measuring Axis Extension with DIC-Based Transducers

Sensors ◽  
2021 ◽  
Vol 21 (12) ◽  
pp. 4104
Author(s):  
Nassr Al-Baradoni ◽  
Peter Groche
Keyword(s):  
Cost Effective ◽  
Image Correlation ◽  
Maximum Deviation ◽  
Single Image ◽  
Eccentric Load ◽  
Load Bearing ◽  
Out Of Plane ◽  
Axis Extension ◽  
Plane Displacement ◽  
Imaging Sensor

In this paper we present a novel, cost-effective camera-based multi-axis force/torque sensor concept for integration into metallic load-bearing structures. A two-part pattern consisting of a directly incident and mirrored light beam is projected onto the imaging sensor surface. This allows the capturing of 3D displacements, occurring due to structure deformation under load in a single image. The displacement of defined features in size and position can be accurately analyzed and determined through digital image correlation (DIC). Validation on a prototype shows good accuracy of the measurement and a unique identification of all in- and out-of-plane displacement components under multiaxial load. Measurements show a maximum deviation related to the maximum measured values between 2.5% and 4.8% for uniaxial loads ( and between 2.5% and 10.43% for combined bending, torsion and axial load. In the course of the investigations, the measurement inaccuracy was partly attributed to the joint used between the sensor parts and the structure as well as to eccentric load.

scholarly journals Locally Corroded Stiffener Effect on Shear Buckling Behaviors of Web Panel in the Plate Girder

2015 ◽  
Vol 2015 ◽  
pp. 1-19 ◽  
Author(s):  
Jungwon Huh ◽  
In-Tae Kim ◽  
Jin-Hee Ahn
Keyword(s):  
Corrosion Damage ◽  
Element Analysis ◽  
Buckling Strength ◽  
Lower Shear ◽  
Out Of Plane ◽  
Shear Buckling ◽  
Buckling Failure ◽  
Plane Displacement ◽  
The Web ◽  
Plate Girder

The shear buckling failure and strength of a web panel stiffened by stiffeners with corrosion damage were examined according to the degree of corrosion of the stiffeners, using the finite element analysis method. For this purpose, a plate girder with a four-panel web girder stiffened by vertical and longitudinal stiffeners was selected, and its deformable behaviors and the principal stress distribution of the web panel at the shear buckling strength of the web were compared after their post-shear buckling behaviors, as well as their out-of-plane displacement, to evaluate the effect of the stiffener in the web panel on the shear buckling failure. Their critical shear buckling load and shear buckling strength were also examined. The FE analyses showed that their typical shear buckling failures were affected by the structural relationship between the web panel and each stiffener in the plate girder, to resist shear buckling of the web panel. Their critical shear buckling loads decreased from 82% to 59%, and their shear buckling strength decreased from 88% to 76%, due to the effect of corrosion of the stiffeners on their shear buckling behavior. Thus, especially in cases with over 40% corrosion damage of the vertical stiffener, they can have lower shear buckling strength than their design level.

Mechanism of the Transition From In-Plane Buckling to Helical Buckling for a Stiff Nanowire on an Elastomeric Substrate

2016 ◽  
Vol 83 (4) ◽  
Author(s):  
Youlong Chen ◽  
Yong Zhu ◽  
Xi Chen ◽  
Yilun Liu
Keyword(s):  
High Performance ◽  
Three Dimensional ◽  
Stretchable Electronics ◽  
Buckling Mode ◽  
Design And Optimization ◽  
Out Of Plane ◽  
Plane Direction ◽  
Plane Displacement ◽  
Helical Buckling ◽  
Selection Of

In this work, the compressive buckling of a nanowire partially bonded to an elastomeric substrate is studied via finite-element method (FEM) simulations and experiments. The buckling profile of the nanowire can be divided into three regimes, i.e., the in-plane buckling, the disordered buckling in the out-of-plane direction, and the helical buckling, depending on the constraint density between the nanowire and the substrate. The selection of the buckling mode depends on the ratio d/h, where d is the distance between adjacent constraint points and h is the helical buckling spacing of a perfectly bonded nanowire. For d/h > 0.5, buckling is in-plane with wavelength λ = 2d. For 0.27 < d/h < 0.5, buckling is disordered with irregular out-of-plane displacement. While, for d/h < 0.27, buckling is helical and the buckling spacing gradually approaches to the theoretical value of a perfectly bonded nanowire. Generally, the in-plane buckling induces smaller strain in the nanowire, but consumes the largest space. Whereas the helical mode induces moderate strain in the nanowire, but takes the smallest space. The study may shed useful insights on the design and optimization of high-performance stretchable electronics and three-dimensional complex nanostructures.

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