Material Interaction Effects in the Reliability of High Density Interconnect (HDI) Boards
Keyword(s):
This paper studies several base substrate materials and interlayer dielectric materials for High Density Interconnect (HDI) boards, addressing reliability issues such as warpage, dielectric cracking and microvia cracking. Design of simulation models with an optimization technique is developed to study material interaction effects on the HDI reliability. A plastic strain gradient-based computational algorithm is developed to study the thermo-mechanical deformation of fine-feature microvia structures.