Nanomechanics of Peeling Studied Using the Atomic Force Microscope

2007 ◽  
Author(s):  
Mark C. Strus ◽  
Arvind Raman ◽  
Luis Zalamea ◽  
R. Byron Pipes ◽  
Cattien V. Nguyen
Keyword(s):  
Atomic Force Microscope ◽  
Practical Knowledge ◽  
Peel Test ◽  
Dynamic Force ◽  
Multiwalled Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nonlinear Flexure ◽  
Pulling Force ◽  
Opening And Closing

Through adaptation of an atomic force microscope, we have developed a peel test at the micro- and nanoscale level that has the capability of investigating how long flexible nanotubes, nanowires, nanofibers, proteins, and DNA adhere to various substrates. This novel atomic force microscopy (AFM) peeling mode extends existing AFM “pushing” and “pulling” force spectroscopies by offering practical knowledge about the complex interplay of nonlinear flexure, friction, and adhesion when one peels a long flexible molecule or nanostructure off a substrate. The static force peeling spectroscopies of straight multiwalled carbon nanotubes suggest that a significant amount of the total peeling energy is channeled into nanotube flexure. Meanwhile dynamic force spectroscopies offer invaluable information about the dissipative physical processes involved in opening and closing a small “crack” between the nanotube and substrate.

scholarly journals Amplitude response of conical multiwalled carbon nanotube probes for atomic force microscopy

RSC Advances ◽  
2019 ◽  
Vol 9 (1) ◽  
pp. 429-434 ◽  
Author(s):  
Xiao Hu ◽  
Hang Wei ◽  
Ya Deng ◽  
Xiannian Chi ◽  
Jia Liu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Atomic Force Microscope ◽  
Axial Compression ◽  
Multiwalled Carbon Nanotube ◽  
Amplitude Response ◽  
Multiwalled Carbon ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force

Impressive stability of conical carbon nanotube atomic force microscope probes is shown under axial compression during tapping mode.

scholarly journals Probing nano-scale viscoelastic response in air and in liquid with dynamic atomic force microscopy

Soft Matter ◽  
2018 ◽  
Vol 14 (19) ◽  
pp. 3998-4006 ◽  
Author(s):  
Federica Crippa ◽  
Per-Anders Thorén ◽  
Daniel Forchheimer ◽  
Riccardo Borgani ◽  
Barbara Rothen-Rutishauser ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Atomic Force Microscope ◽  
Polymer Blend ◽  
Viscoelastic Response ◽  
Dynamic Force ◽  
Force Measurements ◽  
Force Microscopy ◽  
Atomic Force ◽  
Soft Polymer

We perform a comparative study of dynamic force measurements using an Atomic Force Microscope (AFM) on the same soft polymer blend samples in both air and liquid environments.

scholarly journals Using Antibodies to Make Images

2000 ◽  
Vol 8 (3) ◽  
pp. 3-7
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Magnetic Field ◽  
High Resolution ◽  
Atomic Force Microscope ◽  
Alternating Magnetic Field ◽  
Scanning Probe ◽  
Dynamic Force ◽  
Topographic Image ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Mode

The atomic force microscope (AFM), the workhorse of scanning probe microscopes, has become even more versatile. Anneliese Raab, Wenhai Han, Dirk Badt, Sandra Smith-Gill, Stuart Lindsay, Hansgeorg Schindler, and Peter Hinterdorfer have demonstrated that the AFM, in the dynamic force mode, can use antibodies as a probe. Dynamic force microscopy uses a magnetized tip that is oscillated in an alternating magnetic field as the tip scans the surface. This provides a very gentile interaction that can be recorded as a high resolution topographic image. Raab et al., showed that more information can be obtained from the specimen.

Sensor Egregium – An Atomic Force Microscope Sensor for Continuously Variable Resonance Amplification

2021 ◽  
pp. 1-23
Author(s):  
Rafiul Shihab ◽  
Tasmirul Jalil ◽  
Burak Gulsacan ◽  
Matteo Aureli ◽  
Ryan Tung
Keyword(s):  
Finite Element Analysis ◽  
Atomic Force Microscope ◽  
Natural Frequencies ◽  
Proof Of Concept ◽  
Element Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Wide Range ◽  
Curve Veering ◽  
Dynamic Phenomena

Abstract Numerous nanometrology techniques concerned with probing a wide range of frequency dependent properties would benefit from a cantilevered sensor with tunable natural frequencies. In this work, we propose a method to arbitrarily tune the stiffness and natural frequencies of a microplate sensor for atomic force microscope applications, thereby allowing resonance amplification at a broad range of frequencies. This method is predicated on the principle of curvature-based stiffening. A macroscale experiment is conducted to verify the feasibility of the method. Next, a microscale finite element analysis is conducted on a proof-of-concept device. We show that both the stiffness and various natural frequencies of the device can be highly controlled through applied transverse curvature. Dynamic phenomena encountered in the method, such as eigenvalue curve veering, are discussed and methods are presented to accommodate these phenomena. We believe that this study will facilitate the development of future curvature-based microscale sensors for atomic force microscopy applications.

Atomic Force Microscopy

2021 ◽  
pp. 379-400
Author(s):  
C. Julian Chen
Keyword(s):  
Atomic Force Microscopy ◽  
Entire Range ◽  
Tunneling Current ◽  
Vibrational Amplitude ◽  
Dynamic Mode ◽  
Dynamic Force ◽  
Force Detection ◽  
Static Mode ◽  
Force Microscopy ◽  
Atomic Force

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the static mode and the dynamic mode. The general design and the typical method of manufacturing of the cantilevers are discussed. Two popular methods of static force detection are presented. The popular dynamic-force detection method, the tapping mode is described, especially the methods in liquids. The non-contact AFM, which has achieved atomic resolution in the weak attractive force regime, is discussed in detail. An elementary and transparent analysis of the principles, including the frequency shift, the second harmonics, and the average tunneling current, is presented. It requires only Newton’s equation and Fourier analysis, and the final results are analyzed over the entire range of vibrational amplitude. The implementation is briefly discussed.

Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe

2006 ◽  
Vol 100 (7) ◽  
pp. 074315 ◽  
Author(s):  
Osamu Takeuchi ◽  
Takaaki Miyakoshi ◽  
Atsushi Taninaka ◽  
Katsunori Tanaka ◽  
Daichi Cho ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Control ◽  
Force Spectroscopy ◽  
Dynamic Force ◽  
Atomic Force Microscopy Probe ◽  
Dynamic Force Spectroscopy ◽  
Force Microscopy ◽  
Spectroscopy Measurement ◽  
Atomic Force
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