scholarly journals Dynamic Force Microscopy Study on Si(111)√3×√3-Ag Using a Tuning Fork Atomic Force Microscope

2011 ◽  
Vol 9 ◽  
pp. 26-29
Author(s):  
Manfred Lange ◽  
Dennis van Vörden ◽  
Rolf Möller
Keyword(s):  
Atomic Force Microscope ◽  
Tuning Fork ◽  
Microscopy Study ◽  
Dynamic Force ◽  
Force Microscopy ◽  
Atomic Force

Nanomechanics of Peeling Studied Using the Atomic Force Microscope

2007 ◽  
Author(s):  
Mark C. Strus ◽  
Arvind Raman ◽  
Luis Zalamea ◽  
R. Byron Pipes ◽  
Cattien V. Nguyen
Keyword(s):  
Atomic Force Microscope ◽  
Practical Knowledge ◽  
Peel Test ◽  
Dynamic Force ◽  
Multiwalled Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nonlinear Flexure ◽  
Pulling Force ◽  
Opening And Closing

Through adaptation of an atomic force microscope, we have developed a peel test at the micro- and nanoscale level that has the capability of investigating how long flexible nanotubes, nanowires, nanofibers, proteins, and DNA adhere to various substrates. This novel atomic force microscopy (AFM) peeling mode extends existing AFM “pushing” and “pulling” force spectroscopies by offering practical knowledge about the complex interplay of nonlinear flexure, friction, and adhesion when one peels a long flexible molecule or nanostructure off a substrate. The static force peeling spectroscopies of straight multiwalled carbon nanotubes suggest that a significant amount of the total peeling energy is channeled into nanotube flexure. Meanwhile dynamic force spectroscopies offer invaluable information about the dissipative physical processes involved in opening and closing a small “crack” between the nanotube and substrate.

scholarly journals Probing nano-scale viscoelastic response in air and in liquid with dynamic atomic force microscopy

Soft Matter ◽  
2018 ◽  
Vol 14 (19) ◽  
pp. 3998-4006 ◽  
Author(s):  
Federica Crippa ◽  
Per-Anders Thorén ◽  
Daniel Forchheimer ◽  
Riccardo Borgani ◽  
Barbara Rothen-Rutishauser ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Comparative Study ◽  
Atomic Force Microscope ◽  
Polymer Blend ◽  
Viscoelastic Response ◽  
Dynamic Force ◽  
Force Measurements ◽  
Force Microscopy ◽  
Atomic Force ◽  
Soft Polymer

We perform a comparative study of dynamic force measurements using an Atomic Force Microscope (AFM) on the same soft polymer blend samples in both air and liquid environments.

scholarly journals Using Antibodies to Make Images

2000 ◽  
Vol 8 (3) ◽  
pp. 3-7
Author(s):  
Stephen W. Carmichael
Keyword(s):  
Magnetic Field ◽  
High Resolution ◽  
Atomic Force Microscope ◽  
Alternating Magnetic Field ◽  
Scanning Probe ◽  
Dynamic Force ◽  
Topographic Image ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Mode

The atomic force microscope (AFM), the workhorse of scanning probe microscopes, has become even more versatile. Anneliese Raab, Wenhai Han, Dirk Badt, Sandra Smith-Gill, Stuart Lindsay, Hansgeorg Schindler, and Peter Hinterdorfer have demonstrated that the AFM, in the dynamic force mode, can use antibodies as a probe. Dynamic force microscopy uses a magnetized tip that is oscillated in an alternating magnetic field as the tip scans the surface. This provides a very gentile interaction that can be recorded as a high resolution topographic image. Raab et al., showed that more information can be obtained from the specimen.

scholarly journals Steady state charge conduction through solution processed liquid crystalline lanthanide bisphthalocyanine films

2019 ◽  
Vol 23 (11n12) ◽  
pp. 1603-1615
Author(s):  
Chandana Pal ◽  
Isabelle Chambrier ◽  
Andrew N. Cammidge ◽  
A. K. Sharma ◽  
Asim K. Ray
Keyword(s):  
Metal Ions ◽  
Liquid Crystalline ◽  
Microscopy Study ◽  
Individual Characteristics ◽  
Central Metal ◽  
Force Microscopy ◽  
Atomic Force ◽  
Double Decker ◽  
Order Of Magnitude ◽  
Chain Lengths

In-plane electrical characteristics of non-peripherally octyl(C[Formula: see text]H[Formula: see text]- and hexyl(C[Formula: see text]H[Formula: see text]-substituted liquid crystalline (LC) double decker lanthanide bisphthalocyanine (LnPc[Formula: see text] complexes with central metal ions lutetium (Lu), and gadolinium (Gd) have been measured in thin film formulations on interdigitated gold (Au) electrodes for the applied voltage ([Formula: see text] range of [Formula: see text]. The conduction mechanism is found to be Ohmic within the bias of [Formula: see text] while the bulk limited Poole–Frenkel mechanism is responsible for the higher bias. The compounds show individual characteristics depending on the central metal ions, substituent chain lengths and their mesophases. Values of 67.55 [Formula: see text]cm[Formula: see text] and 42.31 [Formula: see text]cm[Formula: see text] have been obtained for room temperature in-plane Ohmic conductivity of as-deposited octyl lutetium (C[Formula: see text]LuPc[Formula: see text] and hexyl gadolinium (C[Formula: see text]GdPc[Formula: see text] films, respectively while C[Formula: see text]GdPc[Formula: see text] films exhibit nearly two orders of magnitude smaller conductivity. On annealing at 80[Formula: see text]C, Ohmic conductivities of C[Formula: see text]LuPc[Formula: see text] and C[Formula: see text]GdPc[Formula: see text] are found to have increased but the conductivity of C[Formula: see text]GdPc[Formula: see text] decreased by more than one order of magnitude to 1.5 [Formula: see text]cm[Formula: see text]. For physical interpretation of the charge transport behavior of these three molecules, their UV-vis optical absorption spectra in the solution and in as-deposited and annealed solid phases and atomic force microscopy study have been performed. It is believed that both orientation and positional reorganizations are responsible, depending upon the size of the central ion and side chain length.

Low-volume liquid delivery and nanolithography using a nanopipette combined with a quartz tuning fork-atomic force microscope

Nanoscale ◽  
2012 ◽  
Vol 4 (20) ◽  
pp. 6493 ◽  
Author(s):  
Sangmin An ◽  
Corey Stambaugh ◽  
Gunn Kim ◽  
Manhee Lee ◽  
Yonghee Kim ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Atomic Force ◽  
Low Volume ◽  
Liquid Delivery

Adsorption of Polyethylenimine on Graphite:  An Atomic Force Microscopy Study

2003 ◽  
Vol 36 (25) ◽  
pp. 9510-9518 ◽  
Author(s):  
Marc Schneider ◽  
Martin Brinkmann ◽  
Helmuth Möhwald
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force
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