On Debris-Fretting Impact—The Study of Oxide and Chromium Layer Application

2020 ◽  
Vol 7 (2) ◽  
Author(s):  
Marcin Kopeć ◽  
Ondřej Pašta ◽  
Martina Malá ◽  
Patricie Halodová ◽  
Ladislav Cvrček ◽  
...  
Keyword(s):  
Nuclear Power ◽  
Focused Ion Beam ◽  
Positive Impact ◽  
Protective Coatings ◽  
Ion Beam ◽  
Protective Layer ◽  
Fretting Wear ◽  
Nuclear Power Generation ◽  
Chromium Layer ◽  
Energy Agency

Abstract The fretting phenomenon was responsible for over 50% of fuel failure cases in the years 2010–2015 according to International Atomic Energy Agency (IAEA). It shows the scale of the problem for the nuclear power generation sector. A big share of this issue is related to debris fretting. Although debris fretting has been studied for decades, the available R&D information is scarce. The presented paper summarizes the work performed in the Research Center Řež (CVŘ) on Zr–1%Nb alloy tube specimens covered with protective coatings—passivation oxide layer and pure chromium layer. The tests included the simulation of debris-fretting conditions and detailed analysis using scanning electron microscopy (SEM), energy-dispersive X-ray (EDX), and focused ion beam (FIB). Those experiments are a part of a wider project devoted to the research in the specification of the fretting wear increase after applying the protective layer. The first outputs show the positive impact even in the case of an oxide layer's presence on the cladding surface.

scholarly journals A Method for Producing Site-Specific TEM Specimens from Low Contrast Materials with Nanometer Precision

2013 ◽  
Vol 19 (1) ◽  
pp. 73-78 ◽  
Author(s):  
Henrik Pettersson ◽  
Samira Nik ◽  
Jonathan Weidow ◽  
Eva Olsson
Keyword(s):  
Electron Microscope ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Main Idea ◽  
Protective Layer ◽  
Low Contrast ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Different Types ◽  
Contrast Materials

AbstractA method that enables high precision extraction of transmission electron microscope (TEM) specimens in low contrast materials has been developed. The main idea behind this work is to produce high contrast markers on both sides of and close to the area of interest. The markers are filled during the depositing of the protective layer. The marker material can be of either Pt or C depending on which one gives the highest contrast. It is thereby possible to distinguish the location of the area of interest during focused ion beam (FIB) milling and ensure that the TEM sample is extracted precisely at the desired position. This method is generally applicable and enables FIB/scanning electron microscope users to make high quality TEM specimens from small features and low contrast materials without a need for special holders. We explain the details of this method and illustrate its potential by examples from three different types of materials.

scholarly journals Optimization of the In Situ Biasing FIB Sample Preparation for Hafnia-Based Ferroelectric Capacitor

Micromachines ◽  
2021 ◽  
Vol 12 (12) ◽  
pp. 1436
Author(s):  
Qilan Zhong ◽  
Yiwei Wang ◽  
Yan Cheng ◽  
Zhaomeng Gao ◽  
Yunzhe Zheng ◽  
...  
Keyword(s):  
Sample Preparation ◽  
Success Rate ◽  
Performance Optimization ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Random Access ◽  
Protective Layer ◽  
Structure Characterization ◽  
Ferroelectric Capacitor

Hafnia-based ferroelectric (FE) thin films have received extensive attention in both academia and industry, benefitting from their outstanding scalability and excellent CMOS compatibility. Hafnia-based FE capacitors in particular have the potential to be used in dynamic random-access memory (DRAM) applications. Obtaining fine structure characterization at ultra-high spatial resolution is helpful for device performance optimization. Hence, sample preparation by the focused ion beam (FIB) system is an essential step, especially for in situ biasing experiments in a transmission electron microscope (TEM). In this work, we put forward three tips to improve the success rate of in situ biasing experiments: depositing a carbon protective layer to position the interface, welding the sample on the top of the Cu column of the TEM grid, and cutting the sample into a comb-like shape. By these means, in situ biasing of the FE capacitor was realized in TEM, and electric-field-induced tetragonal (t-) to monoclinic (m-) structure transitions in Hf0.5Zr0.5O2 FE film were observed. The improvement of FIB sample preparation technology can greatly enhance the quality of in situ biasing TEM samples, improve the success rate, and extend from capacitor sample preparation to other types.

scholarly journals LEGAL PERSPECTIVES ON NUCLEAR ENERGY AND SUSTAINABLE DEVELOPMENT IN MALAYSIA

2020 ◽  
Vol 5 (1) ◽  
pp. 169-188
Author(s):  
Farahdilah Ghazali ◽  
Abdul Haseeb Ansari ◽  
Maizatun Mustafa ◽  
Wan Mohd Zulhafiz Wan Zahari
Keyword(s):  
Power Generation ◽  
Sustainable Development ◽  
Developing Countries ◽  
Energy Security ◽  
Nuclear Power ◽  
Nuclear Energy ◽  
Atomic Energy ◽  
Nuclear Power Generation ◽  
Power Sector ◽  
Energy Agency

This paper explores the potential of nuclear energy, particularly in the power sector, to solve energy challenges and to address the pertinent issues regarding energy sustainability in Malaysia. The deployment of nuclear energy in various developed and developing countries has conspicuously helped sustaining energy security and sustainability due to its compatibility and protection of the environment. In addition to energy security, nuclear energy also offers significant benefits to socio-economic aspects. Thus, nuclear energy in developing countries, including Malaysia, has the potential to emerge as a new prospect in the energy sector using sophisticated technology and expert personnel to maximize the energy benefits with the least environmental risk. This step would certainly meet future energy demands and help accelerate the country’s development with optimum energy generation in the country. Therefore, Malaysia should aim to resort to nuclear power generation whereby the current power sector is mainly generated by traditional means, with only a small fraction of it being renewable energy. With no experience in this field, Malaysia needs to establish collaboration with some country rich with nuclear-resource in order to build, maintain nuclear reactors and treat nuclear wastes. The development of such facility should also comply with the requirements of the International Atomic Energy Agency. Moreover, Malaysia has to introduce legislation and policies related to future nuclear energy. Thus, this paper discusses some of the pertinent issues related to the prospects of nuclear power generation in the country towards achieving Sustainable Development Goals (SDGs).   Keywords: Atomic energy, energy security, governance, sustainable development.   Cite as: Ghazali, F., Ansari, A. H., Mustafa, M., & Wan Zahari, W. M. Z. (2020). Legal perspectives on nuclear energy and sustainable development in Malaysia. Journal of Nusantara Studies, 5(1), 169-188. http://dx.doi.org/10.24200/jonus.vol5iss1pp169-188

NanoFIBrication of a Two-Dimensional Phononic Crystal in a Free Standing Membrane

2010 ◽  
Author(s):  
Drew Goettler ◽  
Mehmet Su ◽  
Roy Olsson ◽  
Ihab El-Kady ◽  
Zayd Leseman
Keyword(s):  
Silicon Substrate ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Phononic Crystal ◽  
Protective Layer ◽  
Surface Damage ◽  
Two Dimensional ◽  
Silicon Membrane ◽  
Free Standing ◽  
Simple Cubic

A two-dimensional phononic crystal (PnC) that can operate in the GHz range is created in a freestanding silicon substrate using NanoFIBrication (using a focused ion beam (FIB) to fabricate nanostructures). First, a simple cubic 6.75 × 6.75 μm array of vias with 150 nm spacing is generated. After patterning the vias, they are backfilled with void-free tungsten scatterers. Each via has a diameter of 48 nm. Numerical calculations predict this 2D PnC will generate a band gap near 22 GHz. A protective layer of chromium on top of the thin (100 nm) silicon membrane confines the surface damage to the chromium, which can be removed at a later time. Inspection of the underside of the membrane shows the vias flaring out at the exit, which we are dubbing the ‘trumpet effect’. The trumpet effect is explained by modeling the lateral damage in a freestanding membrane.

Failure Analysis of a Transistor Lead

2000 ◽  
Author(s):  
Yasushi Deguchi ◽  
Sumio Matsuda ◽  
Jiro Aoki ◽  
Takashi Tamura ◽  
Yasunobu Iwai ◽  
...  
Keyword(s):  
Sulfuric Acid ◽  
Low Power ◽  
Failure Analysis ◽  
Cross Section ◽  
Focused Ion Beam ◽  
Protective Coatings ◽  
Ion Beam ◽  
Worst Case ◽  
Dissolved Ions ◽  
Plating Layer

Abstract We investigated the cause of the whisker/discoloration which were found in the transistor lead of stocks (package type TO-18, low power use). In process of the investigation, we estimate two corrosion models that the first model is the remnant of sulfuric acid in cracks of the nickel-phosphorus plating layer in the transistor lead, the second model is the out-gassing or the dissolved ions from the stock container and conductive mat. As the results of the investigation which includes analyses of the whisker/discoloration cross section made by FIB (Focused Ion Beam), a reproductive experiment and so on, the whisker/discoloration were the corrosion reacted between the solder (Pb-Sn) on the transistor lead and SO42- ions of the stock container. We estimate that the new corrosion will not occur and grow in mounted devices because of rejecting the source of corrosion (stock containers). Further, in the worst case of the corrosion occurrence, protective coatings were applied to the mounted transistor lead, as the measure against falling away from the transistor lead.

Novel Plasma FIB/SEM for High Speed Failure Analysis and Real Time Imaging of Large Volume Removal

2012 ◽  
Author(s):  
T. Hrnčíř ◽  
F. Lopour ◽  
M. Zadražil ◽  
A. Delobbe ◽  
O. Salord ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Cross Sections ◽  
Large Volume ◽  
Metal Ion ◽  
High Speed ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Protective Layer ◽  
Ion Source ◽  
Rough Milling

Abstract The standard Ga focused ion beam (FIB) technology is facing challenges because of a request for large volume removal. This is true in the field of failure analysis. This article presents the first combined tool which can fulfill this requirement. This tool offers the combination of a high resolution scanning electron microscope (SEM) and a high current FIB with Xe plasma ion source. The article focuses on failure analysis examples and discusses the different steps of extra large cross sections (deposition of protective layer, rough milling, and polishing). Several applications of the novel Xe plasma FIB/SEM instrument are shown with respect to the failure analysis. The performance of the instrument is tested and discussed in comparison to gallium liquid metal ion source FIB systems. Results show that the Xe plasma FIB offers much higher milling rate, greatly reducing the time necessary for many failure analysis tasks.

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