Compressible Narrow Groove Analysis—Part 2: Computation of Pressure Field in a Spherical Device Rotating in Either Direction

1998 ◽  
Vol 120 (4) ◽  
pp. 765-771 ◽  
Author(s):  
Coda H. T. Pan
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
High Performance ◽  
Pressure Field ◽  
High Vacuum ◽  
Numerical Procedure ◽  
Vacuum State ◽  
Companion Paper ◽  
Accommodation Coefficient ◽  
Reversed Rotation

Compressible Narrow Groove Analysis, as derived in a companion paper (Pan, 1998), is a model implementation of Thin Film High-Resolution Modeling for gas films. This paper describes the numerical procedure to compute the pressure field in a centered spherical device, which has general design features originally intended for a high performance gas bearing gyroscope (Keating and Pan, 1968). The number of groove patterns is varied to bring out the significance of the local compressibility number. Increased local compressibility, associated with reduced number of groove patterns, causes successive degradation of the pressurization capacity until it is entirely suppressed at 32 groove patterns. Further study is made with reversed rotation to create a high vacuum state in the gas film concurrent with a large compressibility number. The evacuation operation (with reversed rotation) is relatively insensitive to the number of groove patterns, but is highly dependent on the accommodation coefficient. Experience in preparing these examples lends evidence to the robustness of Thin Film High-Resolution Modeling. Trouble free iterative computations are routinely performed for the local Knudsen number in excess of 109 and the effective local compressibility number larger than 100.

High-resolution scanning electron microscopy of thin-film magnetic media of magnetic recording disk

1992 ◽  
Vol 50 (2) ◽  
pp. 1334-1335
Author(s):  
K. Ogura ◽  
H. Nishioka ◽  
N. Ikeo ◽  
T. Kanazawa ◽  
J. Teshima
Keyword(s):  
Thin Film ◽  
Fine Structure ◽  
High Resolution ◽  
Magnetic Recording ◽  
High Performance ◽  
Magnetic Hysteresis ◽  
Grain Structure ◽  
Magnetic Media ◽  
Cross Sectional ◽  
Resolution Observation

Structural appraisal of thin film magnetic media is very important because their magnetic characters such as magnetic hysteresis and recording behaviors are drastically altered by the grain structure of the film. However, in general, the surface of thin film magnetic media of magnetic recording disk which is process completed is protected by several-nm thick sputtered carbon. Therefore, high-resolution observation of a cross-sectional plane of a disk is strongly required to see the fine structure of the thin film magnetic media. Additionally, observation of the top protection film is also very important in this field.Recently, several different process-completed magnetic disks were examined with a UHR-SEM, the JEOL JSM 890, which consisted of a field emission gun and a high-performance immerse lens. The disks were cut into approximately 10-mm squares, the bottom of these pieces were carved into more than half of the total thickness of the disks, and they were bent. There were many cracks on the bent disks. When these disks were observed with the UHR-SEM, it was very difficult to observe the fine structure of thin film magnetic media which appeared on the cracks, because of a very heavy contamination on the observing area.

Polymer mask-weakening grain-boundary effect: towards high-performance organic thin-film transistors with mobility closing to 20 cm2 V−1 s−1

2020 ◽  
Vol 4 (10) ◽  
pp. 2990-2994
Author(s):  
Deyang Ji ◽  
Jie Li ◽  
Xiaosong Chen ◽  
Lin Li ◽  
Liqiang Li ◽  
...  
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Grain Boundary ◽  
Thin Film Transistors ◽  
High Performance ◽  
Boundary Effect ◽  
Organic Thin Film Transistors ◽  
Organic Thin Film ◽  
Top Contact ◽  
Grain Boundary Effect

Polystyrene-based masks are fabricated to produce top-contact high-resolution (5 μm) electrodes. With this mask, the mobility of DPA-based thin-film transistors could reach 19.22 cm2 V−1 s−1, which is a new breakthrough for DPA thin-film transistors.

High Performance Dual Gate Blue Laser Annealed Poly-Si Thin-Film Transistor for High-Resolution Displays

2021 ◽  
pp. 1-7
Author(s):  
Duk Young Jeong ◽  
Mohammad Masum Billah ◽  
Abu Bakar Siddik ◽  
Byungju Han ◽  
Yeoungjin Chang ◽  
...  
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
High Performance ◽  
Thin Film Transistor ◽  
Blue Laser ◽  
Dual Gate ◽  
Si Thin Film

Multi-layer thin-film deposition for high-performance X-ray field-emission characteristics

2021 ◽  
pp. 2140043
Author(s):  
Tae Hwan Jang ◽  
Tae Gyu Kim ◽  
Mun Ki Bae ◽  
Kyuseok Kim ◽  
Jaegu Choi
Keyword(s):  
Thin Film ◽  
Field Emission ◽  
High Performance ◽  
Low Voltage ◽  
High Vacuum ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
X Ray ◽  
Emission Effect ◽  
Layer Thin Film

In this study, we developed a nanoscale emitter having a multi-layer thin-film nanostructure in an effort to maximize the field-emission effect with a low voltage difference. The emitter was a sapphire board on which tungsten–DLC multi-player thin film was deposited using PVD and CVD processes. This multi-layer thin-film emitter was examined in a high-vacuum X-ray tube system. Its field-emission efficiency according to the applied voltage was then analyzed.

MHz-Range Fully Printed High-Performance Thin-Film Transistors by Using High-Resolution Gravure-Printed Lines

2015 ◽  
Vol 1 (12) ◽  
pp. 1500155 ◽  
Author(s):  
Rungrot Kitsomboonloha ◽  
Hongki Kang ◽  
Gerd Grau ◽  
William Scheideler ◽  
Vivek Subramanian
Keyword(s):  
Thin Film ◽  
High Resolution ◽  
Thin Film Transistors ◽  
High Performance

Compressible Narrow Groove Analysis—Part 1: Derivation

1998 ◽  
Vol 120 (4) ◽  
pp. 758-764 ◽  
Author(s):  
Coda H. T. Pan
Keyword(s):  
Thin Films ◽  
High Resolution ◽  
Empirical Formula ◽  
Pressure Field ◽  
Data Bank ◽  
Companion Paper ◽  
Global Scale ◽  
The State ◽  
Fine Scale ◽  
Scale Analysis

The technique of High-Resolution Modeling of Thin Films is combined with a two-scale analysis to formulate the Compressible Narrow Groove Analysis. The data bank of Fukui and Kaneko (1990) is emulated in the form of an empirical formula to treat the state of arbitrary rarefaction of the gas film. Due to its transcendental character, the compressible fine-scale solution is treated on the fly as a part of the global-scale computation. Derivations for the Compressible Narrow Groove Analysis are presented here. In a companion paper (Pan, 1998), the Compressible Narrow Groove Analysis is used to compute the pressure field of a spherical device operating in both the pressurizing and evacuating modes.

High Performance N-type Organic Thin-Film Transistors with Inert Contact Metals

2009 ◽  
Vol 1154 ◽  
Author(s):  
Sarah Schols ◽  
Lucas Van Willigenburg ◽  
Robert Müller ◽  
Dieter Bode ◽  
Maarten Debucquoy ◽  
...  
Keyword(s):  
Thin Film ◽  
High Performance ◽  
Film Growth ◽  
High Vacuum ◽  
Thin Film Growth ◽  
Organic Thin Film ◽  
Deposition Fluxes ◽  
Force Microscopy ◽  
Atomic Force ◽  
Substrate Temperatures

AbstractThin film growth by high vacuum evaporation of the n-type organic semiconductor 5, 5″′-diperfluorohexylcarbonyl-2,2′:5′,2″:5″,2″′-quaterthiophene (DFHCO-4T) on poly-(α-methylstyrene)-coated n++-Si/SiO2 substrates is investigated at various deposition fluxes and substrate temperatures. Film characterization by atomic force microscopy reveals typical Stransky-Krastanov growth. Transistors with Au source-drain top contacts and optimized DFHCO-4T deposition conditions attain an apparent saturation mobility of 4.6 cm2/Vs, whereas this parameter is 100× lower for similar transistors with LiF/Al top contacts. We explain this lower performance by the formation of a thin interfacial layer with poor injection properties resulting from a redox reaction between Al and DFHCO-4T.

Fabrication of a high-performance thin film polarizer using lyotropic chromonic liquid crystals using a high-resolution nanoscale template

2017 ◽  
Vol 5 (46) ◽  
pp. 12241-12248 ◽  
Author(s):  
Hyuk Jun Kim ◽  
Woo-Bin Jung ◽  
Hyeon Su Jeong ◽  
Hee-Tae Jung
Keyword(s):  
Thin Film ◽  
Liquid Crystals ◽  
High Resolution ◽  
High Performance ◽  
Potential Applications

Lyotropic chromonic liquid crystals (LCLCs) have attracted attention for their potential applications as thin-film polarizers.

Liquid thin film dewetting-driven micropatterning of reduced graphene oxide electrodes for high performance OFETs

2019 ◽  
Vol 7 (1) ◽  
pp. 153-160 ◽  
Author(s):  
Sung Min Lee ◽  
Seung Keun Song ◽  
Seongwon Yoon ◽  
Dae Sung Chung ◽  
Suk Tai Chang
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Graphene Oxide ◽  
High Resolution ◽  
Reduced Graphene Oxide ◽  
High Performance ◽  
Oxide Electrodes ◽  
Reduced Graphene ◽  
Liquid Thin Films

High resolution micropatterning of rGO electrodes based on the dewetting of liquid thin films is presented.

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