Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs

2016 IEEE 34th VLSI Test Symposium (VTS) ◽

10.1109/vts.2016.7477263 ◽

2016 ◽

Cited By ~ 5

Author(s):

Ali Ahmadi ◽

Amit Nahar ◽

Bob Orr ◽

Michael Past ◽

Yiorgos Makris

Keyword(s):

Cost Reduction ◽

Process Variation ◽

Wafer Level ◽

Test Cost ◽

Test Cost Reduction ◽

Probe Test ◽

Test Flow ◽

Selection For ◽

Level Process ◽

Rf Ics

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A Novel Process Variation Model for Test Cost Reduction in Wafers with Addressable Monitoring Structures

2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict49897.2020.9278230 ◽

2020 ◽

Author(s):

Gui-Feng Ren ◽

Zheng Shi

Keyword(s):

Cost Reduction ◽

Process Variation ◽

Test Cost ◽

Test Cost Reduction ◽

Variation Model

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Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling

2014 International Test Conference ◽

10.1109/test.2014.7035328 ◽

2014 ◽

Cited By ~ 1

Author(s):

Shanghang Zhang ◽

Xin Li ◽

R. D. Blanton ◽

Jose Machado da Silva ◽

John M. Carulli ◽

...

Keyword(s):

Spatial Variation ◽

Cost Reduction ◽

Bayesian Model ◽

Rf Circuits ◽

Wafer Level ◽

Test Cost ◽

Model Fusion ◽

Test Cost Reduction

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Wafer probe test cost reduction of an RF/A device by automatic testset minimization — A case study

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139143 ◽

2011 ◽

Cited By ~ 4

Author(s):

Dragoljub Drmanac ◽

M. Laisne ◽

Li C. Wang

Keyword(s):

Cost Reduction ◽

Test Cost ◽

Test Cost Reduction ◽

Probe Test

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Spatial correlation modeling for probe test cost reduction in RF devices

Proceedings of the International Conference on Computer-Aided Design - ICCAD '12 ◽

10.1145/2429384.2429390 ◽

2012 ◽

Cited By ~ 13

Author(s):

Nathan Kupp ◽

Ke Huang ◽

John M. Carulli ◽

Yiorgos Makris

Keyword(s):

Spatial Correlation ◽

Cost Reduction ◽

Test Cost ◽

Test Cost Reduction ◽

Probe Test ◽

Rf Devices

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Design and Evaluation of a Wafer-level Probe Solution of High Current Step-down DC-DC Converter for Test Time Reduction, Yield Improvement and Overall Test Cost Reduction

2020 IEEE 8th Conference on Systems, Process and Control (ICSPC) ◽

10.1109/icspc50992.2020.9305767 ◽

2020 ◽

Author(s):

Leda Jane Hilario ◽

Ramon Garcia

Keyword(s):

Cost Reduction ◽

Test Time ◽

High Current ◽

Wafer Level ◽

Yield Improvement ◽

Test Cost ◽

Current Step ◽

Test Cost Reduction ◽

Test Time Reduction ◽

Step Down

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Test Cost Reduction Methodology for In-FO Wafer-Level Chip-Scale Package

IEEE Design and Test ◽

10.1109/mdat.2016.2562060 ◽

2016 ◽

pp. 1-1

Author(s):

Kai-Li Wang ◽

Bing-Yang Lin ◽

Cheng-Wen Wu ◽

Mincent Lee ◽

Hao Chen ◽

...

Keyword(s):

Cost Reduction ◽

Wafer Level ◽

Test Cost ◽

Test Cost Reduction ◽

Chip Scale Package

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Reduced-Pin-Count BOST for Test-Cost Reduction

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2021.3065912 ◽

2021 ◽

pp. 1-1

Author(s):

Youngkwang Lee ◽

Young-woo Lee ◽

Sungyoul Seo ◽

Sungho Kang

Keyword(s):

Cost Reduction ◽

Test Cost ◽

Test Cost Reduction

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Black-Box Test-Cost Reduction Based on Bayesian Network Models

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2020.2994257 ◽

2020 ◽

pp. 1-1

Author(s):

Renjian Pan ◽

Zhaobo Zhang ◽

Xin Li ◽

Krishnendu Chakrabarty ◽

Xinli Gu

Keyword(s):

Bayesian Network ◽

Cost Reduction ◽

Network Models ◽

Black Box ◽

Test Cost ◽

Test Cost Reduction ◽

Bayesian Network Models

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Reliable test architecture with test cost reduction for systolic based DNN accelerators

IEEE Transactions on Circuits & Systems II Express Briefs ◽

10.1109/tcsii.2021.3108415 ◽

2021 ◽

pp. 1-1

Author(s):

Muhammad Ibtesam ◽

Umair Saeed Solangi ◽

Jinuk Kim ◽

Muhammad Adil Ansari ◽

Sungju Park

Keyword(s):

Cost Reduction ◽

Test Cost ◽

Reliable Test ◽

Test Cost Reduction ◽

Test Architecture

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A scan disabling-based BAST scheme for test cost reduction

IEICE Electronics Express ◽

10.1587/elex.8.1367 ◽

2011 ◽

Vol 8 (16) ◽

pp. 1367-1373 ◽

Cited By ~ 3

Author(s):

Zhiqiang You ◽

Weizheng Wang ◽

Zhiping Dou ◽

Peng Liu ◽

Jishun Kuang

Keyword(s):

Cost Reduction ◽

Test Cost ◽

Test Cost Reduction

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