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Test Cost Reduction ◽  
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scholarly journals A scan disabling-based BAST scheme for test cost reduction

2011 ◽  
Vol 8 (16) ◽  
pp. 1367-1373 ◽  
Author(s):  
Zhiqiang You ◽  
Weizheng Wang ◽  
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Keyword(s):  
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Kwame Osei Boateng ◽  
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K. Itaya ◽  
M. Emori ◽  
...  
Keyword(s):  
Cost Reduction ◽  
New Method ◽  
Test Cost ◽  
Scan Test ◽  
Test Cost Reduction
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