Estimating Power Supply Noise and its impact on path delay

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231066 ◽

2012 ◽

Cited By ~ 7

Author(s):

Sushmita Kadiyala Rao ◽

Chaitra Sathyanarayana ◽

Ajay Kallianpur ◽

Ryan Robucci ◽

Chintan Patel

Keyword(s):

Power Supply ◽

Path Delay ◽

Power Supply Noise ◽

Supply Noise

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Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2011.2163159 ◽

2011 ◽

Vol 30 (12) ◽

pp. 1923-1934 ◽

Cited By ~ 18

Author(s):

Junxia Ma ◽

Mohammad Tehranipoor

Keyword(s):

Power Supply ◽

Critical Path ◽

Maximum Power ◽

Path Delay ◽

Power Supply Noise ◽

Delay Test ◽

Noise Effects ◽

Critical Path Delay ◽

Supply Noise ◽

Path Delay Test

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Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise

2013 22nd Asian Test Symposium ◽

10.1109/ats.2013.17 ◽

2013 ◽

Cited By ~ 6

Author(s):

Fang Bao ◽

Mohammad Tehranippor ◽

Harry Chen

Keyword(s):

Power Supply ◽

Critical Path ◽

Delay Analysis ◽

Path Delay ◽

Power Supply Noise ◽

Worst Case ◽

Critical Path Delay ◽

Supply Noise

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Scalable dynamic technique for accurately predicting power-supply noise and path delay

2013 IEEE 31st VLSI Test Symposium (VTS) ◽

10.1109/vts.2013.6548903 ◽

2013 ◽

Cited By ~ 11

Author(s):

S. K. Rao ◽

R. Robucci ◽

C. Patel

Keyword(s):

Power Supply ◽

Path Delay ◽

Power Supply Noise ◽

Dynamic Technique ◽

Supply Noise

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Simulation Based Framework for Accurately Estimating Dynamic Power-Supply Noise and Path Delay

Journal of Electronic Testing ◽

10.1007/s10836-013-5425-5 ◽

2013 ◽

Vol 30 (1) ◽

pp. 125-147 ◽

Cited By ~ 6

Author(s):

Sushmita Kadiyala Rao ◽

Ryan Robucci ◽

Chintan Patel

Keyword(s):

Power Supply ◽

Path Delay ◽

Power Supply Noise ◽

Dynamic Power ◽

Supply Noise ◽

Simulation Based

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Robust test generation for power supply noise induced path delay faults

2008 Asia and South Pacific Design Automation Conference ◽

10.1109/aspdac.2008.4484033 ◽

2008 ◽

Cited By ~ 1

Author(s):

Xiang Fu ◽

Huawei Li ◽

Yu Hu ◽

Xiaowei Li

Keyword(s):

Power Supply ◽

Test Generation ◽

Delay Faults ◽

Path Delay ◽

Power Supply Noise ◽

Path Delay Faults ◽

Robust Test ◽

Supply Noise ◽

Induced Path

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Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce

17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems ◽

10.1109/ddecs.2014.6868791 ◽

2014 ◽

Cited By ~ 3

Author(s):

A. Asokan ◽

A. Todri-Sanial ◽

A. Bosio ◽

L. Dilillo ◽

P. Girard ◽

...

Keyword(s):

Power Supply ◽

Path Delay ◽

Power Supply Noise ◽

Delay Test ◽

Supply Noise ◽

Ground Bounce ◽

Path Delay Test

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Framework for dynamic estimation of power-supply noise and path delay

2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) ◽

10.1109/dft.2013.6653618 ◽

2013 ◽

Cited By ~ 1

Author(s):

Sushmita Kadiyala Rao ◽

Ryan Robucci ◽

Chintan Patel

Keyword(s):

Power Supply ◽

Path Delay ◽

Power Supply Noise ◽

Supply Noise ◽

Dynamic Estimation

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AC Power Supply Noise Simulation of CMOS Microprocessor with LSI Chip-Package-Board Integrated Model

IEICE Transactions on Electronics ◽

10.1587/transele.e97.c.264 ◽

2014 ◽

Vol E97.C (4) ◽

pp. 264-271 ◽

Cited By ~ 1

Author(s):

Kumpei YOSHIKAWA ◽

Kouji ICHIKAWA ◽

Makoto NAGATA

Keyword(s):

Power Supply ◽

Integrated Model ◽

Power Supply Noise ◽

Supply Noise ◽

Noise Simulation ◽

Ac Power

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Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration

IEICE Transactions on Fundamentals of Electronics Communications and Computer Sciences ◽

10.1587/transfun.e99.a.2320 ◽

2016 ◽

Vol E99.A (12) ◽

pp. 2320-2327

Author(s):

Cheng-Yu HAN ◽

Yu-Ching LI ◽

Hao-Tien KAN ◽

James Chien-Mo LI

Keyword(s):

Power Supply ◽

Test Pattern ◽

Timing Analysis ◽

Power Supply Noise ◽

Supply Noise

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Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs *

2020 IEEE 29th Asian Test Symposium (ATS) ◽

10.1109/ats49688.2020.9301568 ◽

2020 ◽

Author(s):

Shao-Chun Hung ◽

Yi-Chen Lu ◽

Sung Kyu Lim ◽

Krishnendu Chakrabarty

Keyword(s):

Power Supply ◽

Test Pattern ◽

Power Supply Noise ◽

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

3D Ics ◽

Scan Test ◽

Supply Noise

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