Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction

2006 ◽  
Author(s):  
M. Ashouei ◽  
S. Bhattacharya ◽  
A. Chatterj
Keyword(s):  
Error Correction ◽  
Digital Filters ◽  
Soft Error ◽  
Error Resilient ◽  
Probabilistic Error

A 10T Cell Design without Half Select Problem for Bit-Interleaving Architecture in 65nm CMOS

2013 ◽  
Vol 373-375 ◽  
pp. 1607-1611
Author(s):  
Hong Gang Zhou ◽  
Shou Biao Tan ◽  
Qiang Song ◽  
Chun Yu Peng
Keyword(s):  
Error Correction ◽  
Low Voltage ◽  
Cmos Technology ◽  
Soft Error ◽  
Error Correction Codes ◽  
Cell Design ◽  
Low Voltage Operation ◽  
Sram Cell ◽  
Simulation Results ◽  
Nanometer Regime

With the scaling of process technologies into the nanometer regime, multiple-bit soft error problem becomes more serious. In order to improve the reliability and yield of SRAM, bit-interleaving architecture which integrated with error correction codes (ECC) is commonly used. However, this leads to the half select problem, which involves two aspects: the half select disturb and the additional power caused by half-selected cells. In this paper, we propose a new 10T cell to allow the bit-interleaving array while completely eliminating the half select problem, thus allowing low-power and low-voltage operation. In addition, the RSNM and WM of our proposed 10T cell are improved by 21% and nearly one times, respectively, as compared to the conventional 6T SRAM cell in SMIC 65nm CMOS technology. We also conduct a comparison with the conventional 6T cell about the leakage simulation results, which show 14% of leakage saving in the proposed 10T cell.

scholarly journals SERAD: Soft Error Resilient Asynchronous Design Using a Bundled Data Protocol

2020 ◽  
Vol 67 (5) ◽  
pp. 1667-1677 ◽  
Author(s):  
Sai Aparna Aketi ◽  
Smriti Gupta ◽  
Huimei Cheng ◽  
Joycee Mekie ◽  
Peter A. Beerel
Keyword(s):  
Soft Error ◽  
Asynchronous Design ◽  
Error Resilient

SERL: Soft error resilient latch design

2016 ◽  
Author(s):  
Chun-Wei Jacky Chang ◽  
Hsuan-Ming Ryan Huang ◽  
Yuwen Lin ◽  
Charles H.-P. Wen
Keyword(s):  
Soft Error ◽  
Error Resilient
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