An efficient test relaxation technique for combinational & full-scan sequential circuits

2003 ◽  
Author(s):  
A. El-Maleh ◽  
A. Al-Suwaiyan
Keyword(s):  
Sequential Circuits ◽  
Relaxation Technique ◽  
Efficient Test ◽  
Full Scan

FLOSPAT: Fault Localization by Sensitized Path Transformation

1996 ◽  
Author(s):  
M.W. Heath ◽  
W. Maly
Keyword(s):  
Boolean Functions ◽  
Fault Localization ◽  
Fault Model ◽  
Sequential Circuits ◽  
Fault Identification ◽  
Identification Algorithm ◽  
Path Tracing ◽  
Full Scan ◽  
Diagnostic Resolution ◽  
Test Vectors

Abstract This paper describes a fault identification algorithm for combinational and full-scan sequential circuits called FLOSPAT - Fault Localization by Sensitized Path Transformation [1,2]. The goal of fault identification is to localize a fault to the fewest possible gates and to determine the Boolean functions realized by those gates. Instead of choosing a fault model, FLOSPAT uses fault-independent sensitized path tracing [3] to localize functional deviations. Sensitized path transformation is used to adaptively generate test vectors which improve the diagnostic resolution. The output of FLOSPAT is used for physical defect diagnosis by cross-referencing gate-level defect dictionaries generated by the contamination-defect-fault mapper CODEF [4,5,6].

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