Information capacity of nanowire crossbar switching networks

2006 ◽  
Vol 52 (7) ◽  
pp. 3019-3032 ◽  
Author(s):  
P.P. Sotiriadis
Keyword(s):  
Information Capacity ◽  
Switching Networks ◽  
Crossbar Switching

Information capacity and bandwidth limitations in the SEM

1989 ◽  
Vol 47 ◽  
pp. 84-85
Author(s):  
D. C. Joy ◽  
R. D. Bunn
Keyword(s):  
Signal To Noise Ratio ◽  
Critical Dimension ◽  
Information Capacity ◽  
Acquisition Time ◽  
Signal To Noise ◽  
Sem Image ◽  
Probe Size ◽  
Minimum Number ◽  
Noise Ratio ◽  
Signal Channel

The information available from an SEM image is limited both by the inherent signal to noise ratio that characterizes the image and as a result of the transformations that it may undergo as it is passed through the amplifying circuits of the instrument. In applications such as Critical Dimension Metrology it is necessary to be able to quantify these limitations in order to be able to assess the likely precision of any measurement made with the microscope.The information capacity of an SEM signal, defined as the minimum number of bits needed to encode the output signal, depends on the signal to noise ratio of the image - which in turn depends on the probe size and source brightness and acquisition time per pixel - and on the efficiency of the specimen in producing the signal that is being observed. A detailed analysis of the secondary electron case shows that the information capacity C (bits/pixel) of the SEM signal channel could be written as :

Transputer link reconfiguration: switching networks for 4-valent graphs

1990 ◽  
Vol 137 (4) ◽  
pp. 239 ◽  
Author(s):  
D.A. Nicole ◽  
E.K. Lloyd ◽  
J.S. Ward
Keyword(s):  
Switching Networks

Architecture for large dilated optical TDM switching networks

1993 ◽  
Vol 140 (5) ◽  
pp. 337 ◽  
Author(s):  
D.K. Hunter ◽  
P.J. Legg ◽  
I. Andonovic
Keyword(s):  
Switching Networks ◽  
Tdm Switching
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