A Noncontact Voltage Measurement System for Power-Line Voltage Waveforms

2020 ◽  
Vol 69 (6) ◽  
pp. 2790-2797
Author(s):  
Marcelo A. Haberman ◽  
Enrique M. Spinelli
Keyword(s):  
Measurement System ◽  
Power Line ◽  
Voltage Measurement ◽  
Line Voltage

scholarly journals Research on Transmission Line Voltage Measurement Method of D-Dot Sensor Based on Gaussian Integral

Sensors ◽  
2018 ◽  
Vol 18 (8) ◽  
pp. 2455 ◽  
Author(s):  
Jingang Wang ◽  
Yanhang Zhao ◽  
Wenjiang Li ◽  
Xianglong Zeng ◽  
Juan Tang ◽  
...  
Keyword(s):  
Inverse Problem ◽  
Electric Field ◽  
Transmission Line ◽  
Measurement System ◽  
Measurement Method ◽  
Voltage Measurement ◽  
Line Voltage ◽  
Voltage Sensors ◽  
Gaussian Integral ◽  
Sensor Voltage

D-dot sensors meet the development trend towards the downsizing, automation and digitalization of voltage sensors and is one of research hotspots for new voltage sensors at present. The traditional voltage measurement system of D-dot sensors makes possible the reverse solving of wire potentials according to the computational principles of the electric field inverse problem by measuring electric field values beneath the transmission line. Nevertheless, as it is limited by the solving method of the electric field inverse problem, the D-dot sensor voltage measurement system is struggling with solving difficulties and poor accuracy. To solve these problems, this paper suggests introducing a Gaussian integral into the D-dot sensor voltage measurement system to accurately measure the voltage of transmission lines. Based on studies of D-dot sensors, a transmission line voltage measurement method based on Gaussian integrals is proposed and used for the simulation of the electric field of a 220 kV and a 20 kV transmission line. The feasibility of the introduction of the Gaussian integral to solve transmission line voltage was verified by the simulation results. Finally, the performance of the Gaussian integral was verified by an experiment using the transmission line voltage measurement platform. The experimental results demonstrated that the D-dot sensor measurement system based on a Gaussian integral achieves high accuracy and the relative error is lower than 0.5%.

Research of DC Current Measurement Technology Based on Optical Fiber Thermometry

2011 ◽  
Vol 128-129 ◽  
pp. 686-689 ◽  
Author(s):  
Dan Ping Jia ◽  
Yang Wang ◽  
Song Lin ◽  
Quan Kang Wei
Keyword(s):  
Thin Film ◽  
Optical Fiber ◽  
Measurement System ◽  
Low Voltage ◽  
Low Cost ◽  
Electric Heating ◽  
Measurement Technology ◽  
Voltage Measurement ◽  
Film Sensor ◽  
Dc Current

Thin film sensor has the advantages of small size and low cost, which has become a research hotspot in recent years. A measurement system of passive optical fiber DC current sensor based on the thin film sensors is designed in this article. Designs of electric-heating converter, heating-light converter and low-voltage measurement display system are introduced in detail. Experimental results indicate that the general linear correlation between the time constant of fluorescent lifetime and the voltage across the thin film resistor. The feasibility of measurement system is verified via the results of the experiment.

Design and Evaluation of a High-Accuracy Measurement System for Sheet Resistance of Thin Films

2014 ◽  
Vol 609-610 ◽  
pp. 106-112 ◽  
Author(s):  
Hai Bin Pan ◽  
Jian Ning Ding ◽  
Bao Guo Cao ◽  
Guang Gui Cheng
Keyword(s):  
Thin Films ◽  
Sheet Resistance ◽  
Measurement System ◽  
High Accuracy ◽  
Voltage Measurement ◽  
Switching Circuit ◽  
Digital Output ◽  
Accuracy Measurement ◽  
Output Module ◽  
High Accuracy Measurement

Inspection and measurement for the sheet resistance and resistivity play a pivotal role in the semiconductor industry. In this study, a high-accuracy measurement system for sheet resistance of thin films was designed based on dual-measurement with four-point probe method. The measurement system was composed of a special switching circuit, a digital output module, Keithley 2400 SourceMeter, and a computer running LabVIEW. The special switching circuit designed based on the multiplexer played an important role in current probes and voltage probes automatic switching under the control of virtual instrumentation software LabVIEW and National instruments digital output module hardware NI 9401. Keithley 2400 SourceMeter controlled by LabVIEW was used for two-times high-precision voltage measurement. Van der Pauw correction factor were calculated based on the results of the two-times voltage measurement. Then the sheet resistance of thin films was calculated by LabVIEW softwares powerful computing. The experimental results show that the designed and developed system can meet the needs of fast on-line measurement of thin films sheet resistance with a wide range, and moreover, the accuracy of measurements and the level of automatization have been dramatically improved compared to the conventional measurement system.

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